Power chip testing device and method

Abstract

The invention relates to a power chip testing device and method. The device comprises a control module and at least one switching module, wherein each switching module comprises a charge-over switch. Each change-over switch comprises a first port, a second port, and a third port, wherein the first port selects to be connected with the second port or the third port under the action of a control signal generated by the control module, a branch circuit where the first port is located is connected with a power output end of a tested power chip, and a branch circuit where the second port is located and a branch circuit where the third port is located are respectively connected with different loads. The control module is used for outputting a control signal to each change-over switch, and controlling the first port of each change-over switch to be connected with the second port or the third port, collecting voltage values outputted when the power output end of the tested power chip is connected with different loads, and determining the load performances through voltage values. According to the technical scheme of the invention, the device can test the load performances of the power chip in a full-automatic manner.

Description

technical field [0001] The present disclosure relates to the technical field of chip testing, in particular to a testing device and method for a power chip. Background technique [0002] At present, more and more power modules are integrated into a power management chip (Power Management Unit, PMU for short), and the performance requirements are getting higher and higher. For the first version of the PMU chip, testers are required to verify the performance of each power supply of the first version of the chip, for example, the performance of the chip when the load is from light load to full load, etc. Since it is the performance test of the early chip, in order to reduce costs, usually Testers need to manually test the power supply performance of the first version of the chip, resulting in a very low test efficiency. Contents of the invention [0003] In order to overcome the problems existing in the related technologies, the embodiments of the present disclosure provide ...

AI Technical Summary

Problems solved by technology

For the first version of the PMU chip, testers are required to verify the performance of each power supply of the first version of the chip, for example, the performance of the chip when the load is from light load to full load, etc. Since it is the performance test of the early chip, in order to reduce costs, usually Testers need to manually test the power supply performance of the first version of the chip, resulting in very low test efficiency

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