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Double-tilt sample holder for transmission electron microscope in situ environment

A technology of electron microscope and sample rod, applied in the direction of instruments, scanning probe technology, etc., can solve the problems of inseparability, complicated technology, low versatility, etc., and achieve the effect of simple structure, small size and rapid response

Active Publication Date: 2019-01-01
ZHEJIANG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] However, there are two major defects in the design of this technical solution: first, the technology is complicated and the versatility is low
Not only is the overall technical solution complex, but also the two cannot be separated, so it is necessary to purchase this type of TEM
Second, the object of heating and ventilating the atmosphere is not targeted
However, none of the existing TEM sample holders can achieve this technical goal.

Method used

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  • Double-tilt sample holder for transmission electron microscope in situ environment
  • Double-tilt sample holder for transmission electron microscope in situ environment
  • Double-tilt sample holder for transmission electron microscope in situ environment

Examples

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Embodiment Construction

[0029] Such as figure 2 As shown, the transmission electron microscope in-situ environment double-tilt sample rod mainly includes a handle, a sample rod shaft 5, a sample rod head end 6 and a sample cup for loading samples. The sample cup and shaft fixed, The shaft is rotatably mounted on the sample rod head end 6, The drive is set between the shaft and the tip of the sample rod 6 pivoted The shaft turns the system 12 .

[0030] Such as image 3 As shown, the part where the sample cup is in contact with the sample is an electrode, one end of the sample 8 is in contact with the positive electrode 7A on the sample cup, the other end of the sample 8 is in contact with the negative electrode 7B on the sample cup, and the positive electrode 7A and the negative electrode 7B respectively pass through The wire is connected with the power interface on the handle. The current is loaded on the positive electrode 7A and the negative electrode 7B of the sample cup, the sample 8...

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Abstract

An in-situ environment double-inclined sample rod of a transmission electron microscope provided by the invention mainly comprises a holding handle, a sample rod body, a sample rod head and a sample bottle configured to holding a sample.

Description

technical field [0001] The invention relates to components of a transmission electron microscope, in particular to a biaxial tilting sample rod for a transmission electron microscope. technical background [0002] Transmission Electron Microscope (hereinafter referred to as TEM) is a large-scale experimental device for characterizing the microstructure of materials. It can simultaneously analyze the microstructure, crystal structure, and constituent elements of materials. The imaging principle is that the high-energy electron beam penetrates the sample, the transmitted electron beam is focused and amplified, and the detector is used to collect the signal and form an image. Modern high-resolution transmission electron microscopes can usually achieve atomic-level resolution, especially the rapid development of spherical aberration correction technology in the past five years makes the limit resolution of TEM reach 50 pm. However, it is often difficult to reach the limit resol...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01Q30/02G01Q30/20
Inventor 王宏涛刘嘉斌
Owner ZHEJIANG UNIV
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