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Analysis method for stray radiation of infrared measurement system

A measurement system and stray radiation technology, applied in the field of photoelectric detection, can solve the problems of difficult to continue to improve measurement accuracy, inconvenient suppression of stray radiation, less quantitative analysis work, etc.

Active Publication Date: 2016-10-26
BEIJING INST OF ENVIRONMENTAL FEATURES
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Problems solved by technology

However, the domestic focus is mainly on the analysis of external stray light and imaging stray light, while the quantitative analysis of internal stray radiation in infrared optical systems is less
As a result, it is not convenient to suppress the stray radiation of the infrared optical system, which makes it difficult to continue to improve the measurement accuracy of the system

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  • Analysis method for stray radiation of infrared measurement system
  • Analysis method for stray radiation of infrared measurement system
  • Analysis method for stray radiation of infrared measurement system

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Embodiment Construction

[0050] Exemplary embodiments of the present invention will be described in detail below with reference to the accompanying drawings. The description of the exemplary embodiments is for the purpose of illustration only, and in no way limits the invention and its application or usage.

[0051] In an infrared measurement system, stray radiation is one of the important factors affecting the detection performance of the system. In order to take corresponding measures to suppress stray radiation and quantitatively analyze the suppression effect during equipment development, researchers usually need to conduct quantitative analysis of stray radiation. However, due to the complex characteristics of the stray radiation of the infrared measurement system, domestic researches mainly focus on the external stray light and imaging stray light, while the quantitative analysis of the internal stray radiation of the infrared measurement system is less.

[0052] In view of this, the inventors ...

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Abstract

The invention discloses an analysis method for stray radiation of an infrared measurement system. The analysis method comprises the steps of: determining stray radiation sources in the system, wherein the total number of the stray radiation sources is N, and the stray radiation sources comprise thermal radiation of an optical element and thermal radiation of a mechanical structure; for the i-th stray radiation source, calculating radiation power phi which is radiated on a radiation surface and capable of being received by a detector; analyzing the transmission process of the phi, and calculating an irradiance E of the phi on the detector; and calculating the total irradiance E of the N stray radiation sources on the detector, wherein the N is an integer greater than 1, and the i=1,... N. The analysis method can quantitatively analyze the relationship between stray radiation and temperature, so as to provide theoretical guidance for the suppression of stray radiation at different temperatures. Furthermore, the measurement precision of the system can be effectively improved by effectively suppressing stray radiation at different temperatures.

Description

technical field [0001] The invention relates to the field of photoelectric detection, in particular to a method for analyzing the stray radiation of an infrared measurement system itself. Background technique [0002] Stray radiation refers to non-target radiant energy reaching the target surface of the optical system detector. The harmfulness of stray radiation is that it will greatly reduce the signal-to-noise ratio of the system, and in severe cases, the target signal will be completely lost in the noise caused by stray radiation, so that the system cannot detect the target. Moreover, since the target image contains stray radiation energy, if the stray radiation is not analyzed and corrected in the measurement of the target radiation characteristics, the quantitative measurement accuracy of the system will be affected. [0003] With the application of large-aperture and long-focus infrared systems and the substantial increase in detector sensitivity, stray radiation has ...

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Application Information

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IPC IPC(8): G01M11/02
CPCG01M11/02
Inventor 杨智慧姜维维马勇辉
Owner BEIJING INST OF ENVIRONMENTAL FEATURES
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