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Reproduction method of masked peaks based on optimization of test system

A systematic, multi-objective optimization technology, applied in the direction of testing metals, chemical process analysis/design, special data processing applications, etc., can solve problems such as difficult detection of low-concentration ions

Active Publication Date: 2017-04-19
CHANGSHA HASKY ENVIRONMENTAL PROTECTION TECH DEV CO LTD
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Problems solved by technology

[0004] In view of the problem that low-concentration ion signals are easily masked by high-concentration ion signals when high-concentration ratio polymetallic ions are detected simultaneously, the purpose of the present invention is to provide an index (resolution SD and peak height ratio (PHR) definition method; secondly, design experiments and obtain data, build test system optimization goals, and transform the problem of determining the type and amount of reagents in the test system into a multi-objective optimization problem; then, the application goals are mutually constrained The method converts the multi-objective optimization problem into a single-objective optimization problem, and solves the multi-objective optimization problem based on the fmincon function; finally, analyzes the Pareto front of the multi-objective optimization problem, and finally obtains the dosage range of the optimized test system

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  • Reproduction method of masked peaks based on optimization of test system
  • Reproduction method of masked peaks based on optimization of test system
  • Reproduction method of masked peaks based on optimization of test system

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[0037] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are the Some, but not all, embodiments are invented. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0038] see figure 1 , this embodiment discloses a masking peak reappearance method based on test system optimization, including:

[0039] S1. Construct the two objectives of optimizing the test system based on the defined two indicators that affect the masking peak reappearance, design experiments and obtain experimental data, and analyze the statistical characteristic...

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Abstract

The invention discloses a masking peak reproducing method based on testing system optimization. Based on two targets, an experiment is designed, experimental data is acquired, and a function relationship between the two targets is set up by analyzing the statistical properties of polarogram parameters in the targets and the varieties and dosages of reagents in a testing system. The multiobjective optimization problem is divided into n-1 multiobjective optimization sub-problems P (i) according to the number n of tested ions, and the value of i is determined by comparing the separation degree SD (i) and PHR (i) among the ions under different i values. Then, the multiobjective optimization problem is converted into a single-objective optimization problem through an objective mutual constraint method, and the problem is solved based on a fmincon function. Finally, the Pareto front edge of the multiobjective optimization problem is analyzed, and the varieties and dosage ranges of the reagents in the testing system are obtained. The obtained testing system has high linearity, a low detection limit and high precision and accuracy. The method is suitable for optimization of the testing system during masking peak reproduction under the high-concentration-ratio background.

Description

technical field [0001] The invention relates to the technical field of test system optimization, in particular to a masking peak reappearance method based on test system optimization. Background technique [0002] Simultaneous detection of polymetallic ion concentration has always been the focus of research in the field of analysis and detection. Linear scanning polarography is an important method for ion concentration analysis and detection. Riddle. When the detected polymetallic ions have a high concentration ratio, the polarographic peaks of the high-concentration ions can easily cover the low-concentration metal ion polarographic peaks (masking masked peaks), making detection difficult to achieve and seriously affecting the measurement of the assay method. Accuracy and Resolution. [0003] The research and application of test system optimization methods generally exist in the simultaneous detection of the concentration of multi-metal ions. The simultaneous detection of...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N33/20G06F19/00
CPCG01N33/20G16C20/10
Inventor 阳春华龚娟李勇刚朱红求桂卫华王国伟陈俊名
Owner CHANGSHA HASKY ENVIRONMENTAL PROTECTION TECH DEV CO LTD