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Test method and electronic device

A technology of electronic devices and testing methods, applied in the direction of detecting faulty computer hardware, etc., can solve problems such as different original environments, CPU temperature rise, protection mechanism cannot be executed correctly and accurately segmented, and avoid human misjudgment Effect

Active Publication Date: 2019-07-30
SHENXUN COMP KUNSHAN +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In the case of removing the radiator, because the CPU loses the heat dissipation mechanism, the temperature of the CPU rises too fast, causing the protection mechanism to fail to execute correctly and accurately in sections, and human misjudgment is prone to occur.
In the case of turning off the fan, it is also easy to cause misjudgment of the protection mechanism and make the test environment different from the user's original environment

Method used

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  • Test method and electronic device
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  • Test method and electronic device

Examples

Experimental program
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Embodiment Construction

[0017] figure 1 It is a flow chart of a test method according to an embodiment of the present invention, wherein the test method is suitable for electronic devices operating an operating system in a specific temperature environment (such as a high temperature environment or a low temperature environment, etc.). Please refer to figure 1 , first judge whether to receive an operation instruction (step S101). Then, when an operation instruction is received, a test is obtained, the test is performed, and the fan of the electronic device is turned off (step S102). Wherein, the test corresponds to one of multiple system states of the operating system, including a temperature threshold corresponding to the system state and an entry action of the system state. The test includes: continuously monitoring the temperature of the CPU of the electronic device; and when the temperature of the CPU of the electronic device reaches the temperature threshold of the system state, enabling the fa...

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Abstract

The invention discloses a testing method and an electronic device. The testing method is applicable to the electronic device in which an operation system is operated in a specific temperature environment and comprises the following steps that whether an operation instruction is received or not is judged; when the operation instruction is received, a test is obtained and executed, and a fan of the electronic device is turned off, wherein the test corresponds to one of multiple system states of the operation system and comprises a temperature threshold value corresponding to the system state and an entering motion of the systems state. When the system of the test corresponds to the working mode of the operation system, the test comprises the steps that the temperature value of a central processing unit of the electronic device is continuously monitored; when the temperature value of the central processing unit of the electronic device reaches the temperature threshold value, the fan is turned on, and the entering motion of the system state is executed. By means of the testing method, man-made misjudgment in many tests can be avoided.

Description

[0001] 【Technical field】 [0002] The present invention relates to an electronic device, and in particular to an electronic device and a testing method for the electronic device. [0003] 【Background technique】 [0004] For electronic devices such as personal computers, notebook computers, and tablet computers, usually the designer of the electronic device will set one or more upper and lower temperature limits, so that the central processing unit (Central Processing Unit, CPU) and other heat-consuming components of the electronic device When the temperature upper limit or lower temperature limit is reached, the protection mechanism is activated, and the current operating system of the electronic device is switched into a sleep mode or even directly powered off, so that the electronic components in the electronic device will not be affected by the extreme temperature environment ( For example, more than 100 degrees Celsius or lower than minus 20 degrees Celsius, etc.), causing ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/22
Inventor 吴启荣郭俊佑
Owner SHENXUN COMP KUNSHAN
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