An Automatic Interpretation Method of E-Zone Tracing in Vertical Ionogram Based on Image Processing

Abstract

The present invention provides an image processing-based method for automatically interpreting traces in the E-area of ​​the vertical ionogram, comprising the following steps: a. segmentation of the E-area and F-area of ​​the vertical ionogram; b. detection of candidate tracing areas in the E-area; c. Area exclusion; d. Divide traces into 4 types based on trace diffusion characteristics: the first type is E layer, E2 layer, l-type, f-type, c-type, h-type, r-type, k-type with relatively small diffusion degree , n-type, the second type is E layer, E2 layer, l-type, f-type, c-type, h-type, r-type, k-type, n-type with relatively large diffusion degree, and the third type is Es layer a-type, q-type type, s-type, the fourth type is a mixture of linear traces and s-type traces; e. merge the third type of trace areas; f. perform type identification and measurement on the four types of traces; g. obtain E Area parameters; the method of the present invention fully considers all types of Es layer traces that exist at present, and is a comprehensive ionogram E trace identification method.

Description

technical field [0001] The invention relates to the field of automatic measurement of the vertical ionogram, in particular to an image processing-based automatic interpretation method for the E-zone tracing of the vertical ionogram. Background technique [0002] As a "mirror of solar activity" and a "magnifying glass of atmospheric disturbance", the study of the ionosphere has extremely important academic significance and socio-economic value. At present, various ionospheric detection methods have been developed in various countries in the world, among which ionospheric vertical detection is the oldest ionospheric research and is still widely used on the ground conventional detection method of ionosphere. With the development of ionospheric detection technology, the amount of detection data has become very large, and higher requirements have been put forward for the timeliness of detection data processing. The mode of manual measurement of ionospheric parameters can no longe...

AI Technical Summary

Problems solved by technology

There are defects in the existing technology, and misclassification will occur for ionograms with tracing gaps and deformations in the F layer: there is no type identification and measurement involving E-region traces; E-region trace detection is performed on the preprocessed ionograms, Can cause aggregated noise to be mistaken for traces

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