Parameter measuring system and method of analog circuit
An analog circuit and parameter measurement technology, which is applied in the direction of using digital measurement technology for measurement, measurement device, measurement of electrical variables, etc., to achieve the effect of reducing signal intermediate processing, solving signal distortion, and suppressing interference signals
Inactive Publication Date: 2017-01-11
LANZHOU INST OF TECH
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[0004] In order to solve the above-mentioned technical problems, the present invention provides a parameter measurement system and method of an analog circuit. The present invention overcomes the problems existing in the software and hardware methods for analyzing and designing the analog circuit: one, the multiplication in the signal processing circuit The multiplier multiplies the two signals, reduces the signal intermediate processing, effectively suppresses the interference signal, reduces the complexity of hardware and software implementation, and improves the accuracy of data
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[0033] DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be further described below in conjunction with the accompanying drawings and embodiments:
[0034] figure 1 It is a system block diagram of the present invention. Such as figure 1 As shown, in the embodiment of the parameter measurement system of a kind of analog circuit provided by the present invention, comprise signal source 1, tested analog circuit 2, signal processing circuit 3, analog-to-digital converter 4 and virtual instrument software LabVIEW processing program 5, Among them: the signal generated by the signal source 1 is sent to the tested analog circuit 2, the output signal of the tested analog circuit 2 passes through the signal processing circuit 3, the output signal of the signal processing circuit 3 passes through the analog-to-digital converter 4, and finally the analog-to-digital converter 4 The output signal is processed by the virtual instrument software LabVIEW processing...
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The invention discloses a parameter measuring system and method of an analog circuit. The system is composed of a signal source, a measured analog circuit, a signal processing circuit, an analog-to-digital converter and a virtual instrument software LabVIEW program. A signal generated by the signal source is sent to the measured analog circuit. An output signal of the measured analog circuit passes through the signal processing circuit; an output signal of the signal processing circuit passes through the analog-to-digital converter; and then an output signal of the analog-to-digital converter passes through the virtual instrument software LabVIEW program for processing. Correspondingly, the invention also discloses a parameter measuring method of an analog circuit. With the system and method, a problem of signal distortion after sampling during the parameter measuring process of the analog circuit can be solved effectively; the signal intermediate treatment process is reduced; the interference signal is suppressed effectively; and automatic and real-time measurement for parameter measuring of the analog circuit is realized.
Description
technical field [0001] The invention belongs to the technical field of integrated circuits, and in particular relates to a measurement system and method for analog circuit parameters-amplitude and phase difference. Background technique [0002] Some circuits commonly used in analog circuits, such as amplifier circuits, rectifier circuits, filter circuits, and limiter circuits, have always been the focus of scientific research and application, but the measurement of these circuit parameters and the research on related measurement methods are often ignored. [0003] There are two main methods for analyzing and designing analog circuits: software and hardware methods. Because the software simulation measurement method is simple and easy, the simulation software is commonly used in China to analyze the analog circuit. However, the simulation software for students such as Pspice, Multism, etc. is usually a teaching version or a trial version, and the types of components in the c...
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IPC IPC(8): G01R19/22G01R19/25G01R25/00
Inventor 王永喜胡玫吴记群
Owner LANZHOU INST OF TECH