Dynamic fault tree analysis method based on improved sequential binary decision diagram
A technology of dynamic fault tree and binary decision diagram, applied in the field of data processing, can solve problems such as inability to coexist, not completely independent of each other, invalid nodes in SBDD diagram, etc., and achieve accurate qualitative and quantitative analysis.
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[0040] The technical solution of the invention will be described in detail below in conjunction with the accompanying drawings. The extended SBDD method proposed by this application can effectively convert the dynamic fault tree based on Pandora into SBDD. The method mainly includes two aspects: an improved bottom event sorting rule and a dynamically optimized SBDD generation algorithm. The basic idea of the improved bottom event sorting rule is to use the fault tree structure relationship and the relationship between bottom events to assign different sorting priorities to bottom events. Dynamically optimized SBDD generation algorithm uses extended Shannon formula to generate SBDD on the basis of bottom event sorting queue. In the iterative process of using extended Shannon formula to generate SBDD, the simplified rules are used to delete invalid nodes before each iteration.
[0041] Step 1: Replace the dynamic gate in the dynamic fault tree
[0042] Convert the subtree wit...
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