Elemental Quantitative Analysis Method and System Based on Total Reflection X-ray Fluorescence Spectroscopy

Abstract

The invention relates to a quantitative element analysis method based on total reflection X-ray fluorescence spectrometry and a system thereof. The method includes acquiring a total reflection X-ray fluorescence spectrum of a sample to be detected, acquiring a spectrum background curve from the total reflection X-ray fluorescence spectrum, acquiring a characteristic curve of each preset element from a characteristic curve database, and fitting the total reflection X-ray fluorescence spectrum based on the spectrum background curve and the characteristic curve of each preset element to obtain the concentration of each element in the sample to be detected. The method and the system can overcome a problem that spectrums of an element to be detected and unknown elements interfere mutually in a total spectrum range, and can obtain more accurate quantitative analysis results.

Description

technical field [0001] The invention relates to the technical field of quantitative analysis, in particular to an element quantitative analysis method based on total reflection X-ray fluorescence spectroscopy and an element quantitative analysis system based on total reflection X-ray fluorescence spectroscopy. Background technique [0002] When using total reflection X-ray fluorescence analysis, there is a linear relationship between the amount of the excited analyte and the recorded characteristic X-ray intensity under the ideal total reflection excitation condition. If the sample is a solution, the linear relationship can be expressed as formula (1): [0003] N=BC (1) [0004] Among them, N is the net spectral intensity of the analyte after removing the background; B is a constant coefficient, such as absolute sensitivity; C is the volume concentration of the analyte. Therefore, this formula can provide a theoretical basis for the calculation of element concentration val...

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Problems solved by technology

[0005] When using the traditional method for quantitative analysis of elements, it is necessary to use independent characteristic spectral peaks with strong elements to be measured and less interference for quantitative analysis. However, in actual sample analysis applications, there are usually many elements in the sample, and the concentration of the elements is different. , and there may be interference from unknown elements. At this time, overlapping spectral lines will be a common phenomenon, and it is difficult to find independent and undisturbed characteristic spectral lines. It is especially difficult to quantitatively analyze trace heavy metal elements.

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