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Orthogonal degree adjusting method of photoelectric sensor of double-axis photoelectric autocollimator

A photoelectric autocollimator and photoelectric sensor technology, which is applied in the direction of instruments, optical devices, measuring devices, etc., can solve the problem of vertical adjustment of the two optical paths of the dual-axis photoelectric autocollimator. Dual-axis photoelectric autocollimator photoelectric sensor Orthogonality and other issues to achieve the effect of improving orthogonality, accurate test results, and ensuring verticality

Active Publication Date: 2017-02-15
BEIJING AEROSPACE INST FOR METROLOGY & MEASUREMENT TECH +1
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Problems solved by technology

[0005] The purpose of the present invention is to provide a method for adjusting the orthogonality of the photoelectric sensor of a dual-axis photoelectric autocollimator that solves the problem of the difficulty in adjusting the two optical paths of the dual-axis photoelectric autocollimator perpendicular to each other.

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  • Orthogonal degree adjusting method of photoelectric sensor of double-axis photoelectric autocollimator
  • Orthogonal degree adjusting method of photoelectric sensor of double-axis photoelectric autocollimator
  • Orthogonal degree adjusting method of photoelectric sensor of double-axis photoelectric autocollimator

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Embodiment Construction

[0023] A kind of dual-axis photoelectric autocollimator photoelectric sensor orthogonal degree adjustment method proposed by the present invention is further introduced below in conjunction with the accompanying drawings and embodiments:

[0024] A method for adjusting the orthogonality of a photoelectric sensor of a dual-axis photoelectric autocollimator, comprising the following steps

[0025] Step 1, install the linear array CCD two-dimensional test device;

[0026] The device includes a Y-axis CCD1, an adjustment screw 2, a Y-axis differentiation plate 3, a Y-axis light source 4, an X-axis light source 5, an X-axis differentiation plate 6, an adjustment screw 7, an X-axis CCD8, three beam splitters 9 and a lens 10. Wherein, the X-axis light source 5, the X-axis reticle 6, the beamsplitter A12, the beamsplitter B9 and the lens 10 are optically coaxial, wherein the beamsplitter A12 and the beamsplitter B9 are located between the lens 10 and the X-axis reticle 6 , the adjust...

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Abstract

The invention belongs to the field of design and debugging of photoelectric autocollimators, and specifically relates to an orthogonal degree adjusting method of a photoelectric sensor of a double-axis photoelectric autocollimator in order to solve the problem of difficult adjustment due to two vertical optical paths of the double-axis photoelectric autocollimator. Through an orthogonal transfer method, positions of two reticles and two CCD sensors are adjusted, the operation method of two optical axes is easy and convenient, the method is suitable for adjustment of two optical paths of any double-axis photoelectric autocollimator, and the verticality of the two optical paths can be well guaranteed; and according to the method, the orthogonality of the reticles and CCDs in the middle stage is effectively improved, test results are more accurate, and the reliability is higher.

Description

technical field [0001] The invention belongs to the field of design and debugging of a photoelectric autocollimator, in particular to a method for adjusting the orthogonality of a photoelectric sensor of a biaxial photoelectric autocollimator. Background technique [0002] Dual-axis photoelectric autocollimator is a real-time, non-contact high-precision two-dimensional angle measurement equipment. The core device of the photoelectric autocollimator is the charge-coupled device CCD. Charge-coupled device CCD is a kind of image sensor with mature technology and wide application technology. It has developed very rapidly since the early 1970s. [0003] There are two traditional photoelectric sensor adjustment methods. One is to use a microscope to observe the CCD imaging array, and the other is to use the two differentiation plates on the optical side of the theodolite to image. These two methods can only ensure the orthogonality of the final imaging by adjusting the orthogon...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/26G01C11/00
Inventor 沙春哲王强林森常虹魏小林张辰松高秋娟
Owner BEIJING AEROSPACE INST FOR METROLOGY & MEASUREMENT TECH
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