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Method and device for calibrating optimal image plane of imaging spectrometer

An imaging spectrometer and image plane position technology, which is applied in the field of spectroscopy, can solve problems such as the decrease in the resolution of the spectral band field of view, and achieve the effect of reducing the intensity of detection work and improving detection accuracy

Active Publication Date: 2018-04-13
ACAD OF OPTO ELECTRONICS CHINESE ACAD OF SCI
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AI Technical Summary

Problems solved by technology

The traditional method generally uses a collimator to simulate an object at infinity, uses a reading microscope to measure the focal plane position of the system, and fine-tunes the area array detector to a relatively ideal position based on the focal plane position. The disadvantage of this method is that it uses The measurement and judgment of the visual optical system are greatly affected by personal subjective factors. At the same time, this adjustment method cannot solve the problem of the decline in the resolution of some spectral bands and parts of the field of view to the greatest extent.

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  • Method and device for calibrating optimal image plane of imaging spectrometer
  • Method and device for calibrating optimal image plane of imaging spectrometer
  • Method and device for calibrating optimal image plane of imaging spectrometer

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example 1

[0069] Such as image 3 As shown, it is the flow chart of the optimal image plane calibration of the imaging spectrometer, which mainly includes:

[0070] (a) Determine the system parameters of the measured imaging spectrometer, the focal length f of the imaging spectrometer 成像光谱仪 =224mm, the half-field angle of the imaging spectrometer ω=4°, the detector pixel size p=16um, the focal length of the adjustable collimator on the target surface is f 平行光管 = 1000mm. Then the static transfer function of the imaging spectrometer corresponds to the fringe linewidth of the 1000mm collimator as The dynamic transfer function of the imaging spectrometer corresponds to the fringe linewidth of the 1000mm collimator as According to the calculation results, the reticle pattern is designed as Figure 4 As shown, among them, 14 is the crosshair target; 15 is the point source target; 16 is the stripe target.

[0071] (b) Adjusting the common optical axis of the target adjustable collimator...

example 2

[0076] As mentioned above, the reticle in the embodiment of the present invention has a specific pattern, so that the comprehensive evaluation of the comprehensive aberration, spectral line bending and color distortion of the imaging spectrometer can be realized. This example mainly introduces the imaging spectrometer imaging quality assessment measurement method, such as Figure 6 As shown, it mainly includes:

[0077] (a) Determine the system parameters of the measured imaging spectrometer, the focal length f of the imaging spectrometer 成像光谱仪 =224mm, the half-field angle of the imaging spectrometer ω=4°, the detector pixel size p=16um, the focal length of the adjustable collimator on the target surface is f 平行光管 = 1000 mm. Then the static transfer function of the imaging spectrometer corresponds to the fringe linewidth of the 1000mm collimator as The dynamic transfer function of the imaging spectrometer corresponds to the fringe linewidth of the 1000mm collimator as Ac...

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Abstract

The invention discloses an optimal image plane check method and apparatus of an imaging spectrometer. Positions of a parallel light tube and a reticle plate are scanned by use of a stepping mode, an included angle between the parallel light tube and the optical axis of the imaging spectrometer is adjusted through a three-dimensional revolving stage, an optimal image plane position of the imaging spectrometer is detected through defocus measurement and software analysis processing, it is unnecessary to move the position of the imaging spectrometer frequently, and the detection work intensity is greatly reduced; besides, the optimal imaging image plane position of the imaging spectrometer is fitted by use of method of calculating MTF maximum values of different wavelengths of different fields of view of the imaging spectrometer, and thus the detection precision is remarkably improved; at the same time, by use of the specially-produced reticle plate, the method and apparatus can be applied to integrated evaluation of integrated image errors, spectral line bending and color distortion of the imaging spectrometer; and furthermore, monochromatic light with different wavelengths can be coupled by use of a fiber image transmitting beam, and the method and apparatus can be applied to rapid calibration of a spectrum position of the imaging spectrometer and can also be applied to field spectrum calibration of the imaging spectrometer.

Description

technical field [0001] The invention relates to the field of spectrum technology, in particular to a method and device for calibrating an optimal image plane of an imaging spectrometer. Background technique [0002] Imaging spectrometer is a new generation of remote sensing instrument developed with the demand for earth observation and the progress of optoelectronic technology in recent years. It effectively combines traditional two-dimensional imaging remote sensing technology with spectrometer technology to obtain two-dimensional spatial information At the same time, the spectral information of the target is obtained. The obtained spectral image data includes the spectral information of the target, which can reveal the spectral characteristics and material composition of the ground object, and has a wide range of applications in the detection of the atmosphere, ocean and land. [0003] An important indicator of the airborne wide-field imaging spectrometer is the large fie...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J3/28
CPCG01J3/2823
Inventor 李雅灿周锦松景娟娟冯蕾魏立冬王欣何晓英卜美侠
Owner ACAD OF OPTO ELECTRONICS CHINESE ACAD OF SCI