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Image surface correcting structure for imaging spectrograph

An imaging spectrometer and calibration technology, applied in the direction of using optical devices, measuring devices, color/spectral characteristic measurement, etc., can solve the problems of reduced spectral band resolution, large influence of personal subjective factors, etc., to achieve the overall optimal resolution , The effect of reducing the detection work intensity and improving the detection accuracy

Inactive Publication Date: 2008-01-30
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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Problems solved by technology

The traditional method generally uses a collimator to simulate an object at infinity, uses a reading microscope to measure the focal plane position of the system, and fine-tunes the area array detector to a relatively ideal position based on this focal plane position. The disadvantage of this method is that Using the visual optical system to measure and judge is greatly affected by personal subjective factors. At the same time, this adjustment method cannot solve the problem of resolution degradation in some spectral bands to the greatest extent.

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  • Image surface correcting structure for imaging spectrograph
  • Image surface correcting structure for imaging spectrograph

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Embodiment Construction

[0018] A preferred embodiment of the present invention is provided below in conjunction with Fig. 1~Fig. 3, and be further described in detail:

[0019] Please refer to FIG. 1 first. FIG. 1 is a composition diagram of the high-precision image plane calibration device of the imaging spectrometer of the present invention. As shown in the figure, the step-scan structure 6 is composed of programmable translational scanning and related fixed structural parts. Fig. 2 is the flow chart of the main program of the calibration process of the present invention, initialize and start the CCD area array detector 5 for image acquisition after the start-up program begins to work, and start recording image data after waiting for the initial scan position, scan termination position and scan step length information to be input , until the scanning end position is reached, the image data acquisition is stopped, and then, by analyzing and processing the obtained image data, the focal plane position...

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Abstract

A image surface checkout structure of imaging spectrometer is suitable for assembling and checkout of imaging spectrometer, comprising computer, and collimator, imaging lens, spectrometer, CCD area array probe, which are successively linked as light circuit, and close cycle control linking to the CCD area array probe, and checkout processing module set in the computer. The invention uses programmable moving desk and special checkout software to detect focal plane position of each imaging frequency range with high accuracy, analyzing position and tilt angle of CCD area array probe and ensuring the best overall resolving power of spectrometer imaging frequency range.

Description

technical field [0001] The invention relates to an image plane calibration device for an imaging spectrometer, in particular to a high-precision image plane calibration device for a push-broom type spectral imager. Background technique [0002] Imaging spectrometer is a new generation of remote sensing instrument developed with the needs of earth observation and the progress of optoelectronic technology in recent years. It organically combines traditional two-dimensional imaging remote sensing technology At the same time as spatial information, the spectral image of the target is acquired with high spectral resolution. Since the obtained spectral image data contains spectral information related to the components of the observed target, it can reveal the spectral characteristics, existence and material composition of the surface object, thus making it possible to directly identify the imaging target. Therefore, in the atmosphere, ocean and It has been widely used in land obs...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J3/28G01N21/25G01B11/00G01J3/02
Inventor 何志平方抗美胡培新舒嵘王建宇薛永祺
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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