Stack self-inspection method and device

A stack and sub-function technology, applied in the field of stack self-inspection methods and devices, can solve problems affecting system operation reliability, etc., and achieve the effect of improving program operation efficiency and rapid self-inspection

Active Publication Date: 2017-03-29
TRAFFIC CONTROL TECH CO LTD
View PDF6 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although this method can realize real-time self-inspection, the stack self-inspection function needs to be written in assembly language. During

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Stack self-inspection method and device
  • Stack self-inspection method and device
  • Stack self-inspection method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0042] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is only some embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0043] It should be noted that in the C language programming environment, the stack is mainly used for function calls, and the stack is allocated continuously and repeatedly. When the main function calls a sub-function, the C language compiler will automatically create a continuous stack area for the sub-function at the end of the stack area of ​​...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a stack self-inspection method and a stack self-inspection device. The method comprises the following steps: a main function for controlling a program calls a preset stack self-inspection subfunction to perform self-inspection when the program starts, wherein the preset stack self-inspection subfunction defines a preset size of local variable array and values of all local variables in the local variable array, and the preset size is much larger than the size of a stack used when the subfunction enabling the program to operate normally is called; after the preset stack self-inspection subfunction sends a return value to the main function, the main function is controlled to call the subfunction enabling the program to operate normally, and a compiler distributes a stack area used by the preset stack self-inspection subfunction for the subfunction enabling the program to operate normally; and when the self-inspection of the preset stack self-inspection subfunction is not passed, the program is positioned in an idle loop dead state and no longer returned. According to the method and the device provided by the invention, the C language stack can be effectively and rapidly self-inspected, operation reliability of a system is not influenced, and operation efficiency of the program is improved.

Description

technical field [0001] The invention relates to the field of computer technology, in particular to a stack self-check method and device. Background technique [0002] The key control equipment used in rail transit, nuclear power, aircraft and other environments needs to meet the SIL4 safety level requirements. According to the requirements of IEC 61508, EN50129 and other standards, products that meet the SIL4 safety level requirements need to use the memory used by the processor used in the equipment. Do a self-test. [0003] In the C language compilation environment, the memory used by the processor mainly includes the following spaces: (1) the stack area (stack), which is used to store function parameter values, local variables, and key registers; (2) the heap area ( heap), which is generally allocated and released by the programmer according to the use; (3) static area (static), used to store global variables and static variables; (4) literal constant area, used to store...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G06F9/45
CPCG06F8/43
Inventor 王伟郜春海
Owner TRAFFIC CONTROL TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products