Stack self-inspection method and device
A stack and sub-function technology, applied in the field of stack self-inspection methods and devices, can solve problems affecting system operation reliability, etc., and achieve the effect of improving program operation efficiency and rapid self-inspection
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[0042] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is only some embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.
[0043] It should be noted that in the C language programming environment, the stack is mainly used for function calls, and the stack is allocated continuously and repeatedly. When the main function calls a sub-function, the C language compiler will automatically create a continuous stack area for the sub-function at the end of the stack area of ...
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