Single Event Transient Pulse Width Measurement Circuits, Integrated Circuits and Electronic Devices

Abstract

The invention relates to the technical field of electric pulse width measurement, and relates to a single event transient pulse width measurement circuit. The input end of a latch circuit is connected with an under-measurement signal input end; the first input end and the second input end of the first delay latch circuit of at least one delay latch circuit are connected with the under-measurement signal input end; when the single event transient pulse width measurement circuit comprises more than two delay latch circuits, the first input end of each delay latch circuit is connected with the first output end of the previous delay latch circuit from the second delay latch circuit, and the second input end of each delay latch circuit is connected with the under-measurement signal input end; and after an under-measurement single event transient pulse signal is accessed to the under-measurement signal input end, the latch circuit overturns to drive at least one delay latch circuit to overturn, and the output end of the latch circuit and the second output end of each delay latch circuit of at least one delay latch circuit act as the signal output ends of the single event transient pulse width measurement circuit.

Description

technical field [0001] The invention relates to the technical field of electric pulse width measurement, in particular to a single event transient pulse width measurement circuit, integrated circuit and electronic equipment. Background technique [0002] With the development of technologies in aerospace, military and other fields, more and more integrated circuits need to work in radiation environments. The effect of radiation on integrated circuits is mainly divided into two categories: single event effect and total dose effect. The effect produced by the immediate action of the radiation effect after the circuit. Single event effects can be subdivided into the following three categories: single event soft error effects, potentially dangerous effects, and single event hard error effects. [0003] Among them, the single event soft error effect includes the single event reversal effect, the single event transient effect, the single event multiple reversal effect, etc., whic...

AI Technical Summary

Problems solved by technology

[0006] The present invention solves the technical problem of the small measurable range of the single event transient pulse width measurement circuit in the prior art by providing a single event transient pulse width measurement circuit, an integrated circuit and electronic equipment

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