Multi-satellite asynchronous intelligent test system

A test system and satellite technology, applied in the aerospace field, can solve the problems of high satellite production cost, tight time, long satellite electrical test cycle, etc., and achieve the effect of rapid and simple construction.

Inactive Publication Date: 2017-04-19
SHANGHAI ENG CENT FOR MICROSATELLITES
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Problems solved by technology

[0003] The current comprehensive test platforms are all highly specialized. For the test of one satellite, when multiple satellites are mass-produced, the test phases of each satellite are in series, and there is mutual influence, which makes it impossible to complete the rapid test, making the electrical test cycle of the

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  • Multi-satellite asynchronous intelligent test system
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  • Multi-satellite asynchronous intelligent test system

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Embodiment Construction

[0019] The specific implementation of the multi-satellite asynchronous intelligent test system provided by the present invention will be described in detail below in conjunction with the accompanying drawings.

[0020] Please refer to figure 1 , is a schematic diagram of the framework of the multi-satellite asynchronous intelligent test system.

[0021] The multi-satellite asynchronous intelligent test system includes: front-end equipment 11, control center 12, data storage disk control array 13 and monitoring terminal 14, and the control center 12, data storage disk control array 13 and monitoring terminal 14 are all connected to Ethernet 10.

[0022] The front-end equipment 11 is connected to the satellite 15 and the control center 12 to perform interactive communication respectively. The front-end equipment 11 is used to forward test instructions to the satellite 15 and complete the collection, storage and forwarding of downlink data generated during the test of the satel...

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Abstract

The invention relates to a multi-satellite asynchronous intelligent test system. The multi-satellite asynchronous intelligent test system includes a front end device, a control center, a data storage disk control array and a monitoring terminal; the front end device is used for forwarding test instructions to satellites and completing the acquisition, storage and forwarding of downlink data generated during a satellite test process; the front end device includes a plurality of channels which transmit data to the plurality of satellites respectively; the control center is used for realizing the editing and management of the test instructions, test cases and test rules of the satellites, sending the test instructions to the front end device, receiving and forwarding the downlink data sent by the front end device; the data storage disk control array is used for acquiring and storing the downlink data sent by the control center; the monitoring terminal is used for querying and analyzing the downlink data stored in the data storage disk array; and the control center, the data storage disk control array and the monitoring terminal are all connected into the Ethernet. With the system adopted, parallel testing of a plurality of satellites can be achieved, a batched satellite testing period can be shortened, and costs can be reduced.

Description

technical field [0001] The invention relates to the field of aerospace technology, in particular to a multi-satellite asynchronous intelligent test system. Background technique [0002] The development of satellite constellation mode and the continuous expansion of satellite functions make the satellite test system face many challenges such as time constraints and heavy tasks. Comprehensive testing is an important part of satellite development. The comprehensiveness and accuracy of the testing directly determine the reliability of the satellite's in-orbit operation. The length of the testing cycle is an important factor affecting the cost of the satellite. In order to ensure the correctness of the satellite design and the adequacy of the test, the electrical test of the satellite usually accounts for more than 1 / 3 of the satellite development cycle. [0003] The current comprehensive test platforms are all highly specialized. For the test of one satellite, when multiple sat...

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Application Information

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IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 汪灏孙宁常建平尹超刘芳曹娜
Owner SHANGHAI ENG CENT FOR MICROSATELLITES
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