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Semi-floating gate memory device with u-shaped trench and preparation method thereof

A semi-floating gate, U-shaped technology, which is applied in the field of semi-floating gate memory devices with U-shaped trenches and the field of preparation, can solve the problem of large fluctuations in MOSFET threshold voltage, large fluctuations in junction depth, and between individual performance of semi-floating gate memory devices. problems such as large differences, to achieve the effect of improving access speed and consistent performance parameters

Active Publication Date: 2020-02-14
SHANGHAI INTEGRATED CIRCUIT RES & DEV CENT +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0007] Moreover, the PN junction of the semi-floating gate storage device in the above-mentioned patent documents is formed earlier in the entire front-end process, and undergoes multi-step annealing, and the junction depth fluctuates greatly, which further leads to the following problems:
[0008] ①. The threshold voltage of the side vertical channel MOSFET fluctuates greatly;
[0009] ②. The performance of the semi-floating gate storage devices produced by the above-mentioned patent documents varies greatly among individuals, making it impossible to carry out large-scale integration

Method used

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  • Semi-floating gate memory device with u-shaped trench and preparation method thereof
  • Semi-floating gate memory device with u-shaped trench and preparation method thereof
  • Semi-floating gate memory device with u-shaped trench and preparation method thereof

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Embodiment Construction

[0045] Attached below Figure 3-11 Specific embodiments of the present invention will be described in detail. It should be understood that the invention can have various changes in different examples without departing from the scope of the invention, and that the descriptions and illustrations therein are illustrative in nature rather than limiting the invention.

[0046] Please refer to image 3 , image 3It is a schematic cross-sectional view of the structure of a half-floating gate storage device with a U-shaped trench using a gate-last process proposed by the present invention. As shown in the figure, a semi-floating gate storage device with a U-shaped trench using a gate-last process includes a semiconductor substrate with a first type of doping, and a second type of doping on the semiconductor substrate The source region and the drain region; the semiconductor substrate has a U-shaped trench, the U-shaped trench is located between the source region and the drain regio...

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Abstract

A semi-floating gate storage device with a U-shaped trench and its preparation method, the device comprising: a semiconductor substrate with a first-type doping, and a source region and a drain region with a second-type doping on the semiconductor substrate There is a U-shaped groove in the semiconductor substrate, the U-shaped groove is located between the source region and the drain region, and the sidewall and bottom surface of the U-shaped groove are covered with a first layer of dielectric film; formed on the first layer of dielectric film There is a contact window, and a half-floating gate with the first type of doping is formed on the first layer of dielectric film and in the U-shaped trench. The half-floating gate is in contact with the drain region through the window of the first layer of dielectric film, and the ultra-shallow junction is used. Form a p-n junction diode; cover the top of the half-floating gate to form a second layer of dielectric film; form a control gate on the second layer of dielectric film; Doped source and drain heavily doped regions. Therefore, the present invention can improve the access speed and ensure that the performance parameters between devices are relatively consistent under low operating voltage.

Description

technical field [0001] The present invention relates to the field of integrated circuit manufacturing, in particular to the technical field of semiconductor storage devices, in particular to a semi-floating gate storage device with a U-shaped trench using a gate-last process and a preparation method. Background technique [0002] As semiconductor memory is widely used in various electronic products, different application fields have different requirements on the structure, performance and density of semiconductor memory. For example, Static Random Access Memory (SRAM) has high random access speed and low integration density, while standard Dynamic Random Access Memory (DRAM) has high density and Moderate random access speed. [0003] Commonly used flash memory chips such as USB flash drives use a device called a floating gate transistor. Flash memory is also called "non-volatile memory". The so-called "non-volatile" means that when the chip is not powered, the information...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L27/11517H01L27/11521
CPCH10B41/00H10B41/30
Inventor 师沛
Owner SHANGHAI INTEGRATED CIRCUIT RES & DEV CENT