Apparatus and method for measuring surface topography optically

A technology of surface topography and light beams, applied in the direction of optical devices, measuring devices, optical sensors, etc., can solve problems such as difficult control and inaccurate measurement data

Active Publication Date: 2017-05-31
ALIGN TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The thickness of the coating needs to meet specific, difficult-to-control requirements, which leads to inaccurate measurement data

Method used

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  • Apparatus and method for measuring surface topography optically
  • Apparatus and method for measuring surface topography optically
  • Apparatus and method for measuring surface topography optically

Examples

Experimental program
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Embodiment Construction

[0024] In many embodiments, an apparatus for optically determining surface topography includes a light focusing assembly configured to controllably alter the intensity of a light beam projected toward a three-dimensional structure being measured (e.g., a patient's dentition). depth of focus. Compared to traditional methods that employ a large amount of movement of the light focusing assembly, the light focusing assembly disclosed herein utilizes less, if any, moving parts and is therefore smaller, faster and more compact. Furthermore, the apparatus and methods disclosed herein for optically determining surface topography can be used to vary the depth of focus of a light beam while maintaining telecentricity. Telecentric optics produce a constant image magnification independent of the object distance within a defined telecentric range and, therefore, can advantageously be used to increase the accuracy of the optical measurement system.

[0025] The devices and methods describe...

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PUM

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Abstract

An apparatus is described for determining surface topography of a three-dimensional structure. The apparatus can include a probe (90) and an illumination unit (28,32,34,38) configured to output a plurality of light beams (36). In many embodiments, the apparatus includes a light focusing assembly (42,44). The light focusing assembly can receive and focus each of a plurality of light beams to a respective external focal point. The light focusing assembly can be configured to overlap the plurality of light beams within a focus changing assembly (224,234) in order to move the external focal points along a direction of propagation of the light beams. The apparatus can include a detector (60) having an array of sensing elements configured to measure a characteristic of each of a plurality of light beams returning from the illuminated spots and a processor (24) coupled to the detector and configured to generate data representative of topography of the structure based on the measured characteristic.

Description

Background technique [0001] Various methods have been developed for optically measuring surface topography. For example, optical systems and methods have been developed and employed that can be used to optically measure the surface topography of a patient's teeth. For example, the measured surface topography of teeth can be used to design and manufacture dentures, and / or to determine orthodontic treatment plans to correct malocclusions. [0002] One technique for optically measuring surface topography uses laser triangulation to measure the distance between the surface of the tooth and an optical distance probe inserted into the patient's mouth. However, surface topography measured via laser triangulation may not be as accurate as desired due to sub-optimal reflectivity of surfaces such as teeth. [0003] Other techniques for optically measuring surface topography implemented in the CEREC-1 and CEREC-2 systems commercially available from Siemens GmbH or Sirona Dental Systems...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): A61C9/00G01B11/24
CPCG01B11/24A61C9/0046A61C9/0053A61C1/088A61C9/0066G01B11/25A61B5/0088A61B1/247A61B1/0676A61B5/7228A61B1/00011A61B5/0013A61B5/0022A61B2562/0233A61B1/000094A61B1/00045G01B11/30
Inventor 优素福·阿缇亚塔勒·维科尔
Owner ALIGN TECH
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