Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Apparatus for testing bending strain critical performance of superconducting strand

A technology of bending strain and critical performance, which is applied in the direction of testing the strength of materials by applying a stable bending force, can solve problems such as unsatisfactory requirements, and achieve the effects of shortening the time for changing samples, reliable connection and contact, and reliable contact

Active Publication Date: 2017-07-11
HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
View PDF6 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

With the development of technology and research, the requirements for magnetic field strength have also increased, and Nb 3 Sn and NbTi are limited by their upper critical field (Hc2), and have gradually been unable to meet the demand

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Apparatus for testing bending strain critical performance of superconducting strand
  • Apparatus for testing bending strain critical performance of superconducting strand

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0026] like figure 1 , 2 As shown, a superconducting strand bending strain critical performance testing device includes a sample rod 4, an upper stress loading rod 1, a lower stress loading rod 9, a support rod 5, an upper current lead 3, a lower current lead 7 and a bending test Module 8, the sample rod 4 is a sleeve structure, the upper stress loading rod 1 and the lower stress loading rod 9 are connected by the loading rod guide connecting block 6, and the upper stress loading rod 1 and the lower stress loading rod 9 are located in the sample rod 5. Internally, the upper end of the upper stress loading rod 1 protrudes from the upper end of the sample rod 4, and a dynamic sealing device 2 is provided on the upper end of the sample rod 4. The lower end of the lower stress loading rod 9 protrudes from the lower end of the sample rod 4, and the lower The lower end of the stress loading rod 9 is connected to the bending test module 8, the bending test module 8 is fixedly connec...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an apparatus for testing the bending strain critical performance of a superconducting strand. An upper stress loading rod and a lower stress loading rod are positioned in a sample rod, the upper end of the upper stress loading rod stretches out of the upper end of the sample rod, a dynamic sealing device is arranged at the upper end of the sample rod, the lower end of the lower stress loading rod stretches out of the lower end of the sample rod, the lower end of the lower stress loading rod is connected with a bending test module, the bending test module is fixedly connected with the lower end of the sample rod, an upper current leading wire is connected with a lower current leading wire, the upper current leading wire and the lower current leading wire traverse through the internal of the sample rod, the upper end of the upper current leading wire stretches out of the upper end of the sample rod, the lower end of the lower current leading wire is connected with the bending test module, a supporting rod is positioned in the sample rod, and the lower end of the supporting rod stretches out of the lower end of the sample rod and is fixedly connected with the bending test module. A sample bending stress loading structure has the advantages of novel design, reliable contact at a low temperature, realization of application of a high current, and easiness in operation and no damages to the superconducting strand during sample replacement.

Description

technical field [0001] The invention is a testing device for the critical performance of bending strain of superconducting strands. Background technique [0002] As a kind of clean energy, fusion energy is one of the dream energy of mankind. Tokamak magnetic confinement nuclear fusion device is a reliable device for generating fusion energy, and fully superconducting tokamak is an important guarantee for the continuous operation of fusion reactors. On the basis of the successful establishment and operation of the fully superconducting non-circular cross-section tokemak EAST, China has actively carried out the construction of the International Thermonuclear Experimental Reactor ITER. At the same time, various countries have also started pre-research work on the next generation of fusion reactors. Superconducting cable is an important part of tokamak device, and its technology is the key technology of fusion engineering. Superconducting cables are made by twisting supercondu...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N3/20
CPCG01N3/20
Inventor 毛哲华秦经刚刘方金环戴超武玉刘华军
Owner HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products