Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for performing NVDIMM function test under shell

A testing method and technology for functional testing, applied in functional inspection, detection of faulty computer hardware, error detection/correction, etc., can solve problems such as lost data, data security threats, etc. safety effect

Inactive Publication Date: 2017-09-01
ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
View PDF3 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The high-speed data access capability of DRAM is unmatched by other storage devices, but all data will be lost after an abnormal power failure. Once an abnormal power failure occurs, the data security will be threatened.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0031] The content of the present invention is described in more detail below:

[0032] The specific implementation method is as follows

[0033] 1. Put the NVDIMMtest.efi tool in the U disk and connect to the server to be tested

[0034] 2. Power on the server and enter the shell, find the location of the test tool in the U disk

[0035] 3. Run NVDIMMtest.efi, you can see the following options, through which you can perform various tests

[0036] (0-write data pattern; 1-modify data pattern; 2-view data; 3-automatic test)

[0037] The first test method:

[0038] 1. Use 0 to write data, if you want to modify the written data, use 1 to modify

[0039] 2. After the writing is completed, use 2 to check and confirm that it is correct

[0040] 3. Power off the server and observe the flashing of the NVDIMM indicator to complete the data backup

[0041] 4. Turn on the power, run NVDIMMtest.efi, and use 2 again to check the data in NVDIMM

[0042] 5. Compare with the previously...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a method for performing an NVDIMM function test under a shell and relates to the field of computer server technology. The method comprises the steps that an NVDIMMtest.efi tool is placed in a USB flash disk, and the USB flash disk is connected with a to-be-tested server; the server is powered on and started up to enter the shell, and the position of the test tool in the USB flash disk is found; and NVDIMMtest.efi is run, and multiple tests can be performed through options. The data protection function of an NVDIMM can be verified easily and effectively, and the security and stability of the server can be guaranteed.

Description

technical field [0001] The invention relates to the technical field of computer servers, in particular to a method for performing NVDIMM function testing under a shell. Background technique [0002] Memory is an important component of computers and servers. It can temporarily store computing data in the CPU and exchange data with external memories such as hard disks. The high-speed data access capability of DRAM is unmatched by other storage devices, but all data will be lost after an abnormal power failure. Once an abnormal power failure occurs, the security of the data will be threatened. Therefore, NVDIMM products came into being. While retaining the advantages of high-speed data transmission of DRAM, it can also realize that the system will not lose data when the system is powered off. [0003] NVDIMM is based on ordinary memory DRAM particles, adding flash particles, and connecting a capacitor at the same time. When abnormal power failure occurs, the capacitor supplies...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22G06F11/26
CPCG06F11/2205G06F11/26
Inventor 庞潇
Owner ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products