Wireless testing system for passive intermodulation (PIM) in thermal vacuum environment

A passive intermodulation and wireless testing technology, applied in transmission systems, transmission monitoring, electrical components, etc., can solve problems such as wave-absorbing shielding, reduce the impact of test errors, reduce complexity, and ensure integrity
CN107124235AActive Publication Date: 2017-09-01CHINA ACADEMY OF SPACE TECHNOLOGY

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
CHINA ACADEMY OF SPACE TECHNOLOGY
Publication Date
2017-09-01

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Abstract

The invention belongs to the technical field of testing, and relates to a wireless testing system for passive intermodulation (PIM) in a thermal vacuum environment, which is applicable for wireless PIM testing of a transceiving device or system in the thermal vacuum environment. During PIM testing, the fact that PIM of a testing environment and a testing system meets PIM testing requirements is a precondition for proceeding of the testing. A testing site needs to be qualified for highly strict PIM indicators. As a piece to be tested is placed in the thermal vacuum environment, particularly under the condition of changes between high and low temperatures in the testing environment, PIM testing conditions are even stricter. The system provided by the invention has the advantages that a silicon carbide wave-absorbing shielding cover and shielding films are adopted for shielding of the piece to be tested, so that construction of a low PIM testing environment in the thermal vacuum environment can be effectively achieved, and the PIM testing for the piece to be tested in the thermal vacuum environment can be further realized.
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Description

technical field

[0001] The invention relates to a wireless passive intermodulation test system in a thermal vacuum environment, belongs to the technical field of testing, and is suitable for the wireless passive intermodulation test of a common transceiver or system in a thermal vacuum environment. Background technique

[0002] The passive intermodulation (Passive Intermodulation, hereinafter referred to as PIM) test is very difficult to measure due to its small test magnitude and its uncertainty. As mentioned in "Passive Intermodulation Measurement and Solution" (Telecommunication Technology, Issue 9, 2007), for ordinary microwave passive two-port devices, intermodulation products can be generated under the simultaneous action of two high-power signals, and the usual The measurement method can be tested by the measurement method of forward and reflected intermodulation products.

[0003] The "Mobile Communication Base Station System Passive Intermodulation Performance Test...

Claims

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