Self-adaptive system of drive test environment based on vtsystem

Abstract

The invention discloses a VTSystem-based adaptive system for a drive test environment. The VTSystem-based adaptive system is characterized by comprising a hardware configuration table and a software-controlled matrix switch, wherein the hardware configuration table is used for recording a to-be-connected VT System signal line number and a microprocessor pin number, the hardware configuration table is configured and generated, and is downloaded into the software-controlled matrix switch through a UART; the software-controlled matrix switch comprises a large programmable logic gate array FPGA, a plurality of VTS side signal input circuits and a plurality of TB side signal input circuits; and the FPGA is used for receiving a hardware configuration file through the UART and establishing a virtual channel for a VTS side I / O port and a TB side I / O port according to the hardware configuration file. A lot of wiring time of testing personnel is shortened, and the drive test efficiency is improved.

Description

technical field [0001] The invention relates to an self-adaptation system, in particular to a VTSystem-based drive test environment self-adaptation system. Background technique [0002] With the development and progress of science and technology, the importance of microprocessors in the automotive field is getting higher and higher. While improving the quality requirements of microprocessors, there are also high requirements for driving codes running inside microprocessors. Therefore, the driving test of the microprocessor (abbreviated as TB) based on VTSystem (referred to as VTS) is also widely used. In order to fully test the driving quality of the microprocessor, the limited signal lines on the VT System need to be connected to most of the pins of the target chip. Therefore, during the test process, each test item needs to be manually connected to the VT System. The signal lines are connected to new pins, which not only increases the test time and reduces the test effici...

AI Technical Summary

Problems solved by technology

Since manual connection requires frequent plugging and unplugging, it is prone to miswiring or poor contact of wire connectors during operation.

And due to the complicated wiring, it is difficult for operators to troubleshoot and solve wiring problems in time, which affects the quality of the test

In the statistics of previous project failure cases, failures due to miswiring or poor contact of connectors were as high as 14%

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