Self-adaptive system of drive test environment based on vtsystem

A drive test and self-adaptation technology, applied in the field of self-adaptation systems, can solve the problem that it is difficult for operators to check and solve wiring problems in time, complicated wiring, poor contact and other problems, so as to improve the drive test efficiency, reduce wiring work and introduce The effect of the chance of interference

Inactive Publication Date: 2019-09-20
NANJING FUJITSU NANDA SOFTWARE TECH
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  • Description
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AI Technical Summary

Problems solved by technology

Since manual connection requires frequent plugging and unplugging, it is prone to miswiring or poor contact of wire connectors during operation.
And due to the complicated wiring, it is difficult for operators to troubleshoot and solve wiring problems in time, which affects the quality of the test
In the statistics of previous project failure cases, failures due to miswiring or poor contact of connectors were as high as 14%

Method used

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  • Self-adaptive system of drive test environment based on vtsystem
  • Self-adaptive system of drive test environment based on vtsystem
  • Self-adaptive system of drive test environment based on vtsystem

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Embodiment Construction

[0034] The present invention will be further described in detail below in conjunction with the accompanying drawings and examples. The following examples are explanations of the present invention and the present invention is not limited to the following examples.

[0035] Such as figure 1 Shown, a kind of drive test environment adaptive system based on VTSystem of the present invention comprises hardware configuration table and software controllable matrix switch;

[0036] The hardware configuration table is used to record the VT System signal line number and microprocessor pin number that need to be connected, configure and generate a hardware configuration table, and download it to the software-controllable matrix switch through UART;

[0037]The software-controllable matrix switch includes a large programmable logic gate array FPGA, several VTS-side signal input circuits and several TB-side signal input circuits. The FPGA receives the hardware configuration file through UAR...

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Abstract

The invention discloses a VTSystem-based adaptive system for a drive test environment. The VTSystem-based adaptive system is characterized by comprising a hardware configuration table and a software-controlled matrix switch, wherein the hardware configuration table is used for recording a to-be-connected VT System signal line number and a microprocessor pin number, the hardware configuration table is configured and generated, and is downloaded into the software-controlled matrix switch through a UART; the software-controlled matrix switch comprises a large programmable logic gate array FPGA, a plurality of VTS side signal input circuits and a plurality of TB side signal input circuits; and the FPGA is used for receiving a hardware configuration file through the UART and establishing a virtual channel for a VTS side I / O port and a TB side I / O port according to the hardware configuration file. A lot of wiring time of testing personnel is shortened, and the drive test efficiency is improved.

Description

technical field [0001] The invention relates to an self-adaptation system, in particular to a VTSystem-based drive test environment self-adaptation system. Background technique [0002] With the development and progress of science and technology, the importance of microprocessors in the automotive field is getting higher and higher. While improving the quality requirements of microprocessors, there are also high requirements for driving codes running inside microprocessors. Therefore, the driving test of the microprocessor (abbreviated as TB) based on VTSystem (referred to as VTS) is also widely used. In order to fully test the driving quality of the microprocessor, the limited signal lines on the VT System need to be connected to most of the pins of the target chip. Therefore, during the test process, each test item needs to be manually connected to the VT System. The signal lines are connected to new pins, which not only increases the test time and reduces the test effici...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28
Inventor 汪大伟陈锦程张廉周明英叶洋滔
Owner NANJING FUJITSU NANDA SOFTWARE TECH
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