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High-dimensional space adaptive sampling method and photorealistic image drafting method

An adaptive sampling and high-dimensional space technology, applied in the field of image processing, can solve the problem of low performance, achieve the effect of eliminating distortion and strong practicability

Pending Publication Date: 2017-10-13
SHANGHAI PRECISION METROLOGY & TEST RES INST +1
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Problems solved by technology

Although the above algorithm has achieved good results in the general ray tracing algorithm, the image obtained by the above method still has a lot of noise due to the improvement of the sampling space dimension brought about by the introduction of motion blur and depth of field effects.
The idea of ​​high-dimensional space light path was proposed by Walter to solve this problem, but this idea needs to filter the sampling points in the process of generating sampling points, and the performance is very low when the sampling rate requirement is large

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  • High-dimensional space adaptive sampling method and photorealistic image drafting method
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  • High-dimensional space adaptive sampling method and photorealistic image drafting method

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Embodiment Construction

[0020] The following will combine Figure 1 ~ Figure 3 The high-dimensional space adaptive sampling method and the realistic image rendering method of the present invention are further described in detail.

[0021] The high-dimensional space adaptive sampling method of the present invention is based on a high-dimensional space adaptive sampling algorithm.

[0022] The adaptive sampling of the high-dimensional space in the prior art includes initial sparse sampling and adaptive sampling; the initial sparse sampling adopts a lower sampling rate to initially estimate the luminance function on the high-dimensional space; the adaptive sampling passes the initial sampling Point results are analyzed, and the second round of encrypted sampling is performed in places where the luminance function in the high-dimensional space changes sharply or where the luminance value is large.

[0023] The generation of the initial sparse sampling adopts the uniform distribution function, and the sa...

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Abstract

The invention relates to a high-dimensional space adaptive sampling method and a photorealistic image drafting method. The high-dimensional space adaptive sampling method comprises initial sparse sampling and adaptive sampling and is characterized in that during adaptive sampling, when candidate sampling points are generated, the sampling space is amplified to N times as big as a bounding box of original corresponding KD-Tree nodes, and the N is greater than 1; during initial sparse sampling, the adaptive scale estimation technology is employed to distribute the sampling points in different dimensions. The method is advantaged in that segmentation surface distortion can be eliminated, strong practicality is realized, and photorealistic images can be acquired.

Description

technical field [0001] The invention relates to the technology in the field of image processing, in particular to a high-dimensional space adaptive sampling method and a realistic image rendering method. Background technique [0002] The ray tracing algorithm used in the high-realistic image rendering technology mainly consists of three parts: sampling the dimensions corresponding to the camera and the scene to generate the light path connecting the light source and the camera; calculating the brightness corresponding to the light path; according to the sampling information and the corresponding light path The brightness information is used to reconstruct the image. [0003] The physical model involved in the calculation of the brightness of the light path is based on the energy-conserving lighting brightness drawing equation and the bidirectional reflection distribution function. The former gives the mathematical formula expression of the brightness of the outgoing light ...

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Application Information

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IPC IPC(8): G06T15/06G06T15/20G06T15/50
CPCG06T15/06G06T15/205G06T15/506G06T2200/04
Inventor 邱春芳武博龚丹丹王凌
Owner SHANGHAI PRECISION METROLOGY & TEST RES INST
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