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Method, device and detection system for obtaining shielded area in object under test

A technology for objects and areas to be tested, applied in the field of computers, can solve the problems of detection dead spots and inaccurate foreign object recognition results, and achieve the effect of reducing detection dead spots and improving acquisition accuracy.

Active Publication Date: 2019-11-05
HEFEI MEIYA OPTOELECTRONICS TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, if figure 2 If there is a foreign object in the triangle area marked with a slash, it cannot be recognized, and there will be a detection dead angle, resulting in inaccurate foreign object recognition results

Method used

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  • Method, device and detection system for obtaining shielded area in object under test
  • Method, device and detection system for obtaining shielded area in object under test
  • Method, device and detection system for obtaining shielded area in object under test

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Embodiment Construction

[0029] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary and are intended to explain the present invention and should not be construed as limiting the present invention.

[0030] A method, device and detection system for obtaining a shielded area in an object under test according to embodiments of the present invention will be described below with reference to the accompanying drawings.

[0031] image 3 It is a flowchart of a method for obtaining a shielded area in an object under test according to an embodiment of the present invention. Such as image 3 As shown, the method for obtaining the shielded area in the object under test may include:

[0032] S310. Acquire a first image of the object ...

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Abstract

The invention discloses a method, a device and a detection system for obtaining a shielded area in an object to be tested. The method includes: acquiring a first image of the object to be tested captured by electromagnetic radiation; performing binarization processing on the image; Obtain the left edge point and right edge point of the binarized first image, and fit the first straight line according to the coordinates of the left edge point and the right edge point; translate the first straight line in a preset direction The first preset distance is used to form a second straight line, and the pixels on the second straight line corresponding to the first straight line are translated in a preset direction by a preset city distance to form a new pixel; the first pixel is generated based on the new pixel. Shield the threshold curve, and obtain the first shielding area in the object under test based on this curve. This method can accurately obtain the shielded area in the object under test and minimize detection dead spots.

Description

technical field [0001] The invention relates to the field of computer technology, in particular to a method, device and detection system for acquiring a shielded area in an object to be tested. Background technique [0002] Since the edge of the canned material is usually thick (especially the top area), when the foreign matter detection of the canned material is performed through X-rays, the thicker edge is often misjudged as a foreign matter. For example, as shown in Figure 1(a), it is the original picture of the canned material. When the foreign matter detection of the canned material is carried out by X-ray, the foreign matter recognition result map is obtained, as shown in Figure 1(b), it can be seen that , due to the thick mouth of the canned material, this area is misjudged as a foreign object. [0003] In the related art, the area that affects the foreign matter detection result is usually shielded by a shielding method, so as to avoid the above-mentioned misjudgmen...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T7/11G06T3/00
CPCG06T7/0004G06T2207/10116G06T3/18
Inventor 疏义桂刘松张凯杨逃汪庆花李建峰朱维宁
Owner HEFEI MEIYA OPTOELECTRONICS TECH