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Test question difficulty analysis method and system

An analysis method and technology of test questions, applied in the field of electronic education, can solve problems such as inability to deal with cold data, and achieve the effect of improving accuracy

Inactive Publication Date: 2017-10-27
IFLYTEK CO LTD
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  • Abstract
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Problems solved by technology

[0004] The embodiment of the present invention provides a test question difficulty analysis method and system to solve the problem that the existing test question difficulty evaluation method cannot evaluate the difficulty of cold data, that is, questions that no students have done

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  • Test question difficulty analysis method and system
  • Test question difficulty analysis method and system

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Embodiment Construction

[0070] In order to enable those skilled in the art to better understand the solutions of the embodiments of the present invention, firstly, a brief introduction is made to the existing problem difficulty analysis method. In the prior art, the method based on the educational domain model has greatly improved the effect of the statistical method and the method marked by human experts, but it is still highly dependent on the data. For example, it cannot handle cold data, that is, no students have done it. Questions cannot be assessed for difficulty.

[0071] The method and system for analyzing the difficulty of test questions provided by the present invention, the method obtains the difficulty score of the test questions to be analyzed by extracting the characteristics of the test questions to be analyzed according to the characteristics of the questions, and does not need to perform modeling according to the samples of students' answers in the process to obtain the scores of the ...

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Abstract

The invention discloses a test question difficulty analysis method and system. The method comprises the following steps of: obtaining a to-be-analyzed test question; extracting question features of the to-be-analyzed test questions, wherein the question features comprise a question surface feature, an analysis feature and an answer feature; and obtaining a difficulty score of the to-be-analyzed test question according to the question features of the to-be-analyzed test question and a pre-constructed test question difficulty prediction model. According to the method provided by the invention, the difficulty score of the to-be-analyzed test question is predicted according to the question features of the to-be-analyzed test questions, but is not predicted according to history score distribution condition of the to-be-analyzed test questions, so that test question difficulty evaluation can be carried out on cold data conditions, namely, the questions which are not done by students.

Description

technical field [0001] The invention relates to the field of electronic education, in particular to a method and system for analyzing the difficulty of test questions. Background technique [0002] In recent years, with the continuous advancement and development of computer technology and educational informatization, computer technology and artificial intelligence technology have been gradually applied to various activities of daily education and teaching. As one of the important indicators of examination questions, the difficulty of test questions plays an important role in the selection of questions in the process of building the question bank, the evaluation of students' ability, and personalized learning. [0003] Existing topic difficulty analysis methods mainly include: 1. A method based on manual expert annotation, 2. A method based on simple statistics, and 3. An evaluation method based on an educational domain model. Among them, 1. The method based on the manual ex...

Claims

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Application Information

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IPC IPC(8): G06F17/27G06K9/62
CPCG06F40/205G06F40/30G06F18/214
Inventor 张丹苏喻陈志刚邓晓栋魏思胡国平胡郁
Owner IFLYTEK CO LTD
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