A traceability circuit and method for large capacitance

Abstract

The invention relates to a large-capacitance tracing circuit and a tracing method. The large-capacitance tracing circuit is characterized by comprising a dual-path signal source U1 and U2, a null indicator, a shunt and a dual-path data acquisition system, wherein the first path of signal source U1 of the dual-path signal source is connected with a first driving and isolating circuit A1; the second path of signal source U2 is connected with a second driving and isolating circuit A2; output ends of the first driving and isolating circuit A1 and the second driving and isolating circuit A2 are connected with one end of a tested capacitor and one end of the shunt; the other end of the tested capacitor and the other end of the shunt are connected with the signal end of the null indicator; the output end of the first driving and isolating circuit A1 or the second driving and isolating circuit A2 is also connected with a reference end of the null indicator; and two paths of the dual-path data acquisition system are respectively connected onto two ends of the tested capacitor and the shunt.

Description

technical field [0001] The invention relates to a direct current meter, in particular to a portable direct current high current meter, which is used to meet the on-site test and calibration requirements of direct current high current sources, such as direct current welding machines, magnetic particle flaw detectors and other equipment. Background technique [0002] At present, there are few calibration methods for large capacitors. The main reason is that the impedance of large capacitors is small, and the proportional measurement of small voltages is difficult. The current calibration method mainly relies on the accuracy of small voltage measurement, resulting in low measurement indicators. It is necessary to solve the measurement accuracy of small voltage ratio and small voltage phase, and then solve the problem of traceability of large capacitance. Contents of the invention [0003] In order to solve the above problems, the present invention provides a new type of large...

AI Technical Summary

Problems solved by technology

[0002] At present, there are few calibration methods for large capacitors. The main reason is that the impedance of large capacitors is small, and the proportional measurement of small voltages is difficult.

The current calibration method mainly relies on the accuracy of small voltage measurement, resulting in low measurement indicators. It is necessary to solve the measurement accuracy of small voltage ratio and small voltage phase, and then solve the problem of traceability of large capacitance.

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