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A kind of element quantitative analysis method and device

A quantitative analysis and element technology, applied in the field of spectral analysis, can solve problems such as inaccurate analysis results, and achieve the effect of improving analysis accuracy and stability

Active Publication Date: 2018-04-13
武汉虹石科技有限公司
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  • Claims
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Problems solved by technology

However, in the existing LIBS, the commonly used quantitative analysis methods are prone to inaccurate analysis results due to spectral line fluctuations or interference from other spectral lines

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  • A kind of element quantitative analysis method and device
  • A kind of element quantitative analysis method and device
  • A kind of element quantitative analysis method and device

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Embodiment Construction

[0015] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. The components of the embodiments of the invention generally described and illustrated in the figures herein may be arranged and designed in a variety of different configurations.

[0016] Accordingly, the following detailed description of the embodiments of the invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely represents selected embodiments of the invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art wi...

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Abstract

The present invention provides a method and a device for quantitative analysis of an element, and belongs to the technical field of spectral analysis. The method is as follows: acquiring the concentration and spectral line intensity of at least two target spectral lines of a to-be-detected element of each sample in a calibration sample set, calculating weighted spectral line intensity of the to-be-detected element of each sample according to preset weighting coefficient of each target spectral line and the spectral line intensity of each target spectral line of each sample, finally performing linear fitting according to the concentration of the to-be-detected element of each sample and the calculated weighted spectral line intensity of the to-be-detected element of each sample to determine a calibration curve for quantitative analysis of the to-be-detected element. The method for quantitative analysis of the element takes multiple spectral lines for weighting processing, accurate analysis caused by the reason that when a single spectral line is used in quantitative analysis, spectral line fluctuation can be caused by plasma fluctuation or external interference can be avoided, and the accuracy and stability of system analysis can be effectively improved.

Description

technical field [0001] The invention relates to the technical field of spectral analysis, in particular to an element quantitative analysis method and device. Background technique [0002] With the rapid development of economy and technology, in many fields such as mining, metallurgy, environmental protection, chemical industry, energy, cultural relics, jewelry, food safety, biopharmaceuticals, etc., qualitative or quantitative analysis of material components is required. Laser-induced breakdown spectroscopy (LIBS) is a material composition analysis technique based on atomic emission spectroscopy. At the same time, the characteristic spectrum of the elements produced by the radiation during the evolution of the plasma is collected, and the types and contents of the elements in the sample are analyzed. However, in the existing LIBS, the commonly used quantitative analysis methods are prone to inaccurate analysis results due to spectral line fluctuations or interference from ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/71
CPCG01N21/71
Inventor 曾庆栋余华清童菊芳王波云熊良斌肖永军宣文静张珍云吕昊丁么明
Owner 武汉虹石科技有限公司
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