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Intrinsic safety circuit spark test device and speed regulation method

An intrinsically safe circuit, spark test technology, applied in the direction of measuring devices, measuring electricity, measuring electrical variables, etc., can solve the problems of low detection sensitivity, low detection sensitivity, and low detection efficiency of spark test devices, so as to improve the detection sensitivity and improve the detection efficiency. Detection efficiency, the effect of increasing the number of sparks

Inactive Publication Date: 2017-11-21
NORTH CHINA UNIVERSITY OF TECHNOLOGY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This just causes the detection sensitivity of existing spark test device to be lower
[0006] There are at least the following problems in the prior art: the detection efficiency of the existing spark test device is low, and the detection sensitivity is low

Method used

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  • Intrinsic safety circuit spark test device and speed regulation method
  • Intrinsic safety circuit spark test device and speed regulation method
  • Intrinsic safety circuit spark test device and speed regulation method

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Embodiment Construction

[0034] Embodiments of the present application provide an intrinsically safe circuit spark test device and a speed regulating method.

[0035] In order to enable those skilled in the art to better understand the technical solutions in the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described The embodiments are only some of the embodiments of the present application, but not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall within the scope of protection of this application.

[0036] Fig. 1(a) is a device structure diagram of an embodiment of an intrinsically safe circuit spark test device described in the present application. figure 2 (b) is a top view corresponding to the str...

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PUM

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Abstract

The application provides an intrinsic safety circuit spark test device and speed regulation method. The method includes determining a position of a 90-degree separation point on a moving trajectory of tungsten filaments and a groove, calculating angles of a copper electrode and a cadmium disc electrode turning from initial positions when the tungsten filaments and a groove edge of the cadmium disc electrode separate just at the 90-degree separation point to obtain the periodical change law of the turning angles; and according to the periodical change law, utilizing a first stepping motor and a second stepping motor to control the rotating speed of a rotary electrode holder and the cadmium disc electrode, so that four tungsten filaments and the edge of the groove separate just at the 90-degree separation point at a specified angle interval and time interval. By use of the embodiments of the application, the detection sensitivity and detection efficiency of the spark test device can be effectively improved.

Description

technical field [0001] The present application relates to the technical field of intrinsically safe circuits, in particular to an intrinsically safe circuit spark test device and a speed regulating method. Background technique [0002] Electrical equipment used in explosive gas atmospheres needs to meet the requirements of intrinsic safety. Intrinsically safe circuit refers to a circuit in which any electric spark or any thermal effect generated under specified conditions (including normal operation and specified fault conditions) cannot ignite the specified explosive gas atmosphere. The GB3836.4-2010 standard stipulates that the intrinsic safety performance of the circuit must be evaluated by the explosion detection test performed by the spark test device. When performing a detection test on a certain circuit, it is necessary to connect the tested part of the circuit to the corresponding connection of the spark test device, and use the spark generated by the spark test dev...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
CPCG01R31/003
Inventor 孟庆海王进己
Owner NORTH CHINA UNIVERSITY OF TECHNOLOGY
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