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Multi-scan optical system

An optical system and multi-scanning technology, applied in the field of optical systems, can solve the problems of increasing the cost of optical systems

Inactive Publication Date: 2017-12-29
METAL POWER ANALYTICAL PTE LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the use of multiple CCDs increases the cost of the optical system

Method used

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  • Multi-scan optical system

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Embodiment Construction

[0025] Typically, an optical system used in an atomic emission spectrometer includes an excitation source, multiple lenses, a wavelength selector, and multiple detectors. Typically, the wavelength selector is a single slit configuration. The use of a wavelength selector based on a single slit reduces the stability of conventional optical systems. Additionally, the wavelength selector is configured to direct the composite light to the plurality of detectors. Each of the plurality of detectors is tuned to capture a specific wavelength of diffracted composite light. Typically, these detectors are charge-coupled devices. However, the use of multiple CCDs increases the cost of the optical system.

[0026] now refer to figure 1 The system of the present disclosure is described. figure 1 A schematic diagram of a multi-scan optical system 100 according to an embodiment of the disclosure is shown.

[0027] The present invention contemplates a multi-scan optical system 100 . Mult...

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Abstract

The present disclosure relates to the field of optical systems. The envisaged multi-scan optical system is compact and stable. The system comprises an excitation source, a hydra fiber cable, a wavelength selector, an optical element, and a detector. The excitation source is configured to emit composite light. The hydra fiber cable has a head and a plurality of tentacles, and is configured to receive the composite light via a second lens. The plurality of tentacles is configured to emit the composite light towards the wavelength selector which includes a plurality of optical slits (s1-s8) and a plurality of shutters. The wavelength selector is configured to selectively collect and filter the composite light directed by a first lens and the plurality of tentacles by means of the plurality of shutters. The detector is configured to detect the plurality of spectral line scans reflected by the optical element for spectrometric analysis.

Description

technical field [0001] This disclosure relates to the field of optical systems. Background technique [0002] Typically, an optical system used in an atomic emission spectrometer includes an excitation source, multiple lenses, a wavelength selector, and multiple detectors. Typically, the wavelength selector is a single slit configuration. The use of a wavelength selector based on a single slit reduces the stability of conventional optical systems. Additionally, the wavelength selector is configured to direct the composite light to the plurality of detectors. Each of the plurality of detectors is tuned to capture a specific wavelength of diffracted composite light. Typically, these detectors are charge-coupled devices. However, the use of multiple CCDs increases the cost of the optical system. [0003] Therefore, there is a need for a multi-scan optical system that alleviates the above-mentioned disadvantages of conventional optical systems. Contents of the invention ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/06G01J3/12
CPCG01J3/06G01J3/12G01J2003/066G01J2003/1265G01J3/18G01J3/32G01J2003/065G01J3/0232G01J3/0218G01J3/04G01J3/443G01J3/2803G01J2003/045G01J2003/061G01J2003/282G01N21/3103G01N21/33G01N2201/0826
Inventor 普里亚达桑·迪维亚达桑·潘特
Owner METAL POWER ANALYTICAL PTE LTD