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X-ray diffraction imaging of material microstructures

A microstructure and x-ray technology, applied in the field of x-ray imaging of material microstructure, can solve the problems of unknown individual quality and safety, unallowed components, unguaranteed, etc.

Inactive Publication Date: 2018-01-02
KING ABDULLAH UNIV OF SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

While such destructive testing can provide a statistical basis for the evaluation of all manufactured components, it does not allow for the actual testing of components to be supplied for use
Therefore, their individual quality and safety are still unknown and cannot be guaranteed

Method used

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  • X-ray diffraction imaging of material microstructures
  • X-ray diffraction imaging of material microstructures
  • X-ray diffraction imaging of material microstructures

Examples

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Embodiment Construction

[0013] Various examples of methods and systems related to x-ray imaging of the microstructure of materials are disclosed herein. Reference will now be made in detail to the description of the embodiments as illustrated in the drawings, wherein like reference numerals indicate corresponding parts throughout the several views.

[0014] The mechanical properties of materials depend on their microstructure. Current methods of imaging microstructures can damage components and materials, and require extended time periods to complete. Typically, portions of the component are removed (or cut off) and polished prior to etching the material to emphasize the microstructure. The treated part can then be imaged to observe microstructural details using a microscope. Destructive testing of the part (eg, indentation) can then be performed to determine the corresponding mechanical properties. While this process can be used to correlate the mechanical properties and microstructure of the mat...

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Abstract

Various examples are provided for x-ray imaging of the microstructure of materials. In one example, a system for non-destructive material testing includes an x-ray source configured to generate a beamspot on a test item; a grid detector configured to receive x-rays diffracted from the test object; and a computing device configured to determine a microstructure image based at least in part upon adiffraction pattern of the x-rays diffracted from the test object. In another example, a method for determining a microstructure of a material includes illuminating a beam spot on the material with abeam of incident x-rays; detecting, with a grid detector, x-rays diffracted from the material; and determining, by a computing device, a microstructure image based at least in part upon a diffractionpattern of the x-rays diffracted from the material.

Description

[0001] Cross References to Related Applications [0002] This application claims priority and benefit to co-pending U.S. Provisional Application No. 62 / 148,340, entitled "X-RAY IMAGINGOF MATERIAL MICROSTRUCTURES," filed April 16, 2015, the entire contents of which are incorporated herein by reference. Background technique [0003] For manufactured components, quality control may include material testing of sampled portions of the component. Typically, assessment of material quality involves destructive testing of sampled components to determine mechanical properties such as hardness. While such destructive testing can provide a statistical basis for the evaluation of all manufactured components, it does not allow for the actual testing of components to be supplied for service. Therefore, their individual quality and safety are still unknown and cannot be guaranteed. Contents of the invention [0004] Embodiments of the present disclosure relate to x-ray imaging of material...

Claims

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Application Information

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IPC IPC(8): G01N23/207
CPCG01N23/207G01N23/205G01N2223/0566G01N2223/413
Inventor L.瓦尔加B.瓦尔加V.卡洛
Owner KING ABDULLAH UNIV OF SCI & TECH