A method for studying the products after ion photoexcitation
An after-product, light-excited technology, applied in ion source/gun, parts of particle separator tube, particle separation tube, etc., can solve the problem of inability to detect delayed emission electrons, etc., and achieve the effect of high ion density
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[0027] Such as figure 1 It is a structural schematic diagram of the present invention, and the device mainly includes an ion source (1), an accelerator (2), a time-of-flight mass spectrometer (3), a particle mass selector (4), a magnetic shield (5), an ion beam entrance (6), and Focusing electrode group (7) composed of electrode I (7-1), electrode II (7-2), electrode III (7-3), electrode IV (7-4), electrode V (7-5), and cluster electrodes (8), photoelectron exit (9), composed of electrode VI (10-1), electrode VII (10-2), electrode VIII (10-3), electrode IX (10-4), electrode X (10-5) Composed of mass selective electrode group (10), ion outlet (11), ion detector (12), electron background reduction plate (13), reflector plate (14), ion correction plate (15), extraction electrode (16), Focusing electrodes (17), electron detectors (18), lasers (19), regenerative amplifiers (20), fiber optic oscillators (21), FPGAs (22), signal generators (23), optical signal delay units (24 ), an...
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