Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for detecting surface defects of aluminum-silicon plated products

A technology of defect detection and aluminum-silicon plating, which is applied in the direction of measuring devices, instruments, scientific instruments, etc., can solve the problems of difficult surface defect detection and classification, heavy surface texture, missed detection, etc., to reduce repeated detection of defects, relieve storage pressure, The effect of improving accuracy

Inactive Publication Date: 2020-11-03
TANGSHAN IRON & STEEL GROUP +1
View PDF1 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Since the surface texture of aluminum-silicon-coated products (especially thermoformed products) is quite different from that of conventional galvanized products, and its surface texture is heavier (similar to products with spangles), it brings great difficulties to the detection and classification of surface defects. Especially for minor scratches, dents and other defects, the gray value is slightly different from the texture of the substrate, and false detections and missed detections sometimes occur

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for detecting surface defects of aluminum-silicon plated products
  • Method for detecting surface defects of aluminum-silicon plated products
  • Method for detecting surface defects of aluminum-silicon plated products

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0058] In the detection mode of aluminum-silicon products, set the detection parameters as follows image 3 set up.

[0059] After the detection sensitivity and texture adaptation are set, the detection of surface texture (false defects) is suppressed, and scratches are detected. Such as Figure 4 As shown, the red box indicates that the substrate texture-like false defect is suppressed and detected, and the green box indicates that the scratch defect is detected.

Embodiment 2

[0061] through as Figure 5 In the typical defect images shown, it can be intuitively observed that the area array image has a better ability to restore two-dimensional defects, while the line array image has a better ability to restore three-dimensional defects.

[0062] According to the respective detection advantages of line array and area array cameras, the defect subclassification and program compilation shown in Table 2 below are established.

[0063] Table 2 Establishment of defect subcategories

[0064]

[0065] If (class in [111,314,464]) class = -1;

[0066] The line-scan camera automatically filters the detected two-dimensional defects (line-array spots), and the area-scan camera automatically filters the detected three-dimensional defects (area array scratches, area array edge wrinkles), and realizes the directional optimization of defect detection in different dimensions.

[0067] By adopting the present invention, there are following beneficial effects:

[...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a method for detecting surface defects of aluminum-silicon plated products, and belongs to the technical field of cold-rolled strip steel production quality detection. According to the technical scheme, a detection material group of an aluminum-silicon plated product is established, detection key points of defects of different dimensions are formulated according to different scanning principles and characteristics of a linear array camera and an area-array camera, a two-dimensional defect is detected by using the area-array scanning camera, and a three-dimensional defect is detected by using the linear array scanning camera. The method has the beneficial effects that the detection key points of the linear array camera and the area-array camera are formulated for two-dimensional and three-dimensional defects, the defect classification accuracy of the system is further improved, repeated defect detection is reduced, the storage pressure of the system is relieved,the operation stability of the system is ensured, and the timeliness and accuracy of surface quality judgment of the aluminum-plated silicon product are improved.

Description

technical field [0001] The invention relates to a method for detecting surface defects of aluminum-coated silicon products, which belongs to the technical field of cold-rolled strip steel production quality detection. Background technique [0002] With the advancement of social production technology and the continuous increase of people's demand for high-quality products, the consumption of cold-rolled strip steel widely used in industries such as automobiles and household appliances has also increased. With the intensification of market competition, major steel companies are aiming at the high-end home appliance steel market, and continue to seize market share. Due to the excellent high temperature resistance and corrosion resistance of aluminum-silicon products, their consumption has increased year by year in recent years. However, how to stand out in the fierce market competition and provide users with the required products has become an important management task for majo...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/956
CPCG01N21/956
Inventor 史晓强薛军安董春雨张春宇雷大伟范学广刘冠华李健刘晓燕
Owner TANGSHAN IRON & STEEL GROUP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com