Method and system for inspecting return path vias

A return path and via technology, applied in the return path via inspection method and system field, can solve time-consuming problems, achieve accurate inspection results, eliminate interference from human subjective factors, and shorten inspection time

Active Publication Date: 2021-06-29
ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
View PDF7 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, any PCB board has many vias, so this method is very time-consuming

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and system for inspecting return path vias
  • Method and system for inspecting return path vias
  • Method and system for inspecting return path vias

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0049] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0050] The embodiment of the present invention discloses a return path via inspection method, see Figure 4 The flowchart shown includes:

[0051] Step S11: Identify all signal vias and return path vias in the target PCB.

[0052] It should be noted that there are tens of thousands of vias in the target PCB, and it is impossible to accurately identify the signal vias and return path vias with the naked eye. Therefore, the present invention identifies all sig...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The present application discloses a return path via inspection method and system, the method comprising: identifying all signal vias and return path vias in the target PCB board; calculating the distance between each signal via and all return path vias respectively , to obtain the corresponding N groups of distances; wherein, the N value is consistent with the number of signal vias in the target PCB board; respectively determine the distance with the smallest corresponding distance value from each group of distances, and obtain the corresponding N shortest distances ; Determine whether each shortest distance is less than a preset distance threshold; if yes, determine that the return path via corresponding to the shortest distance complies with the layout specification; if not, determine that the return path via corresponding to the shortest distance does not conform to layout specification. This application calculates the shortest distance between the signal via hole and the return path via using the calculation software commonly used in computers, and then judges whether the return path aperture conforms to the layout specification, which greatly shortens the inspection time of the signal path via.

Description

technical field [0001] The invention relates to the field of circuits, in particular to a method and system for inspecting return path vias. Background technique [0002] A transmission line for a signal carries the signal from one end to the other. All transmission lines are composed of two paths, one of which is called the signal path, and the other is called the return path, such as figure 1 shown. In the four-layer circuit transmission line, such as figure 2 As shown, the first layer circuit and the fourth layer circuit are the signal layer, and the second layer circuit and the third layer circuit are the GND layer, that is, the reference plane. Such as figure 2 As shown in the transmission direction of the signal in , the signal path starts from the first layer circuit and connects to the fourth layer circuit through the signal via. The return current will switch from the third layer circuit back to the second layer circuit. At this time, the return path is disc...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): G06F30/392
CPCG06F30/392
Inventor 陈麒旭
Owner ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products