MBD model array feature quick annotation method for digital detection

An array and model technology, applied in the field of digital detection, can solve problems such as inefficiency, information omission, fallacy, etc., to improve efficiency and accuracy, and achieve the effect of automatic execution

Active Publication Date: 2018-02-16
SHENYANG AEROSPACE UNIVERSITY
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  • Abstract
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The method of manual intervention is not only inefficient, but also has the risk of information omission or even error caused by energy slack or understanding deviation

Method used

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  • MBD model array feature quick annotation method for digital detection
  • MBD model array feature quick annotation method for digital detection
  • MBD model array feature quick annotation method for digital detection

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Embodiment Construction

[0040] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0041] This embodiment uses the MBD model array feature rapid labeling method for digital detection, such as figure 1 The MBD model to be tested is shown for rapid labeling of model array features.

[0042] A fast labeling method for digital detection-oriented MBD model array features, such as figure 2 shown, including the following steps:

[0043] Step 1: Uniformly sample a set of array features from the MBD model to obtain a sampling point cloud that can characterize the shape of each array feature member. The specific method is:

[0044] Step 1.1: Analyze the MBD model according to the existing annotation results of the array feature, identify all the members on the...

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Abstract

The invention provides an MBD model array feature quick annotation method for digital detection and relates to the field of digital detection technology. According to the method, first, uniform sampling is performed on a group of array features on an MBD model, and sampling point clouds are obtained; second, a PCA algorithm and an improved ICP algorithm are adopted to perform rough registration and precise registration among the sampling point clouds, and a matching relation among the sampling point clouds is determined; and last, complementing of annotation information missed by the array features is completed according to the corresponding relation among the sampling point clouds. Through the MBD model array feature quick annotation method for digital detection, on the basis of not intervening an annotation habit of a designer on the array features of the MBD model, complementing of the missing information is automatically completed, the efficiency and accuracy of array feature sizeannotation are improved, array feature objects annotated through the quick annotation method meet the requirement of measurability, and one-to-one correspondence between to-be-checked objects and detection requirements is realized.

Description

technical field [0001] The invention relates to the technical field of digital detection, in particular to a method for quickly labeling MBD model array features oriented to digital detection. Background technique [0002] With the widespread use of Model Based Definition (MBD) technology in the field of product R&D and manufacturing, the digital inspection model based on the MBD model has become a hot spot in academia and industry. The MBD model is used as the only detection basis in the product inspection process and is directly transmitted to the detection equipment, which effectively guarantees the simplification of data sources in the inspection process, and also realizes the rapid transmission and closed-loop management of product data between design, manufacturing and inspection. , which can effectively improve the quality of product development and shorten the development cycle. [0003] In order to ensure the accuracy and completeness of inspection information tran...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06K9/62
CPCG06V10/751
Inventor 屈力刚李亮万景洋张杰卫青廷丁来军张丹雅李静
Owner SHENYANG AEROSPACE UNIVERSITY
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