Method and device for extracting features of electroencephalogram signal

An EEG signal and feature extraction technology, which is applied in medical science, sensors, diagnostic recording/measurement, etc., can solve problems such as poor reliability, difficult EEG signal feature extraction, and high noise, and achieve the effect of improving accuracy

Inactive Publication Date: 2018-02-23
北京翼石科技有限公司 +1
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  • Abstract
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  • Application Information

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Problems solved by technology

In the prior art, there is too much noise in the original signal, and the signal-to-noise ratio of the data after removing the oculoelectric noise in the original signal is lo...

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  • Method and device for extracting features of electroencephalogram signal
  • Method and device for extracting features of electroencephalogram signal
  • Method and device for extracting features of electroencephalogram signal

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Embodiment Construction

[0048] Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. Although exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited by the embodiments set forth herein. Rather, these embodiments are provided for more thorough understanding of the present disclosure and to fully convey the scope of the present disclosure to those skilled in the art.

[0049] Those skilled in the art can understand that, unless otherwise defined, all terms (including technical terms and scientific terms) used herein have the same meaning as commonly understood by those of ordinary skill in the art to which this invention belongs. It should also be understood that terms, such as those defined in commonly used dictionaries, should be understood to have meanings consistent with the meanings in the co...

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Abstract

The embodiment of the invention discloses a method and device for extracting the features of an electroencephalogram signal. The method includes the following steps that each to-be-measured electroencephalogram signal is subjected to de-noising, and an effective electroencephalogram signal corresponding to each to-be-measured electroencephalogram signal is obtained; the energy distribution state of each effective electroencephalogram signal, the signal amplitude distribution change state, the LzC complexity and/or the AR model coefficient are extracted, the initial characteristic value of eachto-be-measured electroencephalogram signal is obtained; the obtained initial characteristic value is subjected to characteristic cleaning, characteristic selection and/or characteristic transformation, the effective characteristic value of each to-be-measured electroencephalogram signal is obtained, effective characteristic values are rapidly and effectively extracted out from the to-be-measuredelectroencephalogram signals, and strong technical support is provided for the implementation and development of the electroencephalogram signal technology, so that the accuracy of the electroencephalogram signal analysis is improved.

Description

technical field [0001] The invention relates to the field of electroencephalogram data analysis, in particular to a method and device for extracting features of electroencephalogram signals. Background technique [0002] The analysis and research of EEG signals play a very important role in neuroscience, psychology, biomedicine and other fields. However, in the process of analyzing the EEG signal, how to accurately extract the corresponding eigenvalues ​​from the EEG signal plays a vital role in the analysis and research of the EEG signal. In the prior art, there is too much noise in the original signal, and the signal-to-noise ratio of the data after removing the oculoelectric noise in the original signal is low, and the reliability is poor, resulting in the loss of detailed information in the signal, and it is difficult to accurately realize brain Feature extraction of electrical signals. [0003] It can be seen that how to provide a feature extraction method that can qu...

Claims

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Application Information

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IPC IPC(8): A61B5/0476
CPCA61B5/7235A61B5/7264A61B5/369
Inventor 赵仑马长书闫天翼王博石国伟
Owner 北京翼石科技有限公司
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