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Film detection method, device and film detection system

A detection method and film layer technology, applied in the field of panel manufacturing, can solve problems such as equipment downtime and panel scrapping, and achieve the effects of reducing production loss, improving production efficiency, and avoiding scrapping

Active Publication Date: 2019-12-24
MIANYANG BOE OPTOELECTRONICS TECH CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The embodiment of the present invention provides a film layer detection method, device and film layer detection system, which can solve the problem that the panel is scrapped or the equipment is down due to the wrong film layer

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  • Film detection method, device and film detection system
  • Film detection method, device and film detection system

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Embodiment Construction

[0062] In order to make the object, technical solution and advantages of the present invention clearer, the implementation manner of the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0063] In the related art, in the process of manufacturing the display panel, it is often necessary to stack and form various film layers on the substrate of the display panel. However, in this process, equipment software failures or communication errors are prone to occur, resulting in wrong film manufacturing sequences, making the The wrong film layer is formed on the substrate, which may lead to adverse effects such as panel scrapping or equipment downtime. The embodiment of the present invention provides a film detection device, which can solve the problems in related technologies, such as figure 1 As shown, the film detection device includes:

[0064] A light source 11 , an image acquisition component 12 and an image analysis com...

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Abstract

A film layer detection method, a film layer detection device, and a film layer detection system. The film layer detection device comprises: a light source (11), an image acquiring assembly (12), and an image analyzing assembly (13). The light source (11) illuminates the side of a substrate (01) to be detected provided with a film layer (02); the image acquiring assembly (12) acquires an image of the film layer (02) from the side of the substrate (01) provided with the film layer (02), the image of the film layer (02) comprising an image of at least one illuminated film layer (02); the image analyzing assembly (13) determines the type of an uppermost film layer (02) in the at least one film layer (02) according to luminance distribution of the image of the film layer (02).

Description

technical field [0001] The invention relates to the field of panel manufacturing, in particular to a film detection method, device and film detection system. Background technique [0002] In recent years, display panels have been widely used, and display panels can be divided into liquid crystal (English: Liquid Crystal Display; abbreviation: LCD) display panels and organic light-emitting diode (English: Organic Light-Emitting Diode; abbreviation: OLED) display panels according to technical characteristics. etc., in the process of manufacturing the display panel, it is often necessary to stack and form various film layers on the substrate of the display panel. [0003] For example, when manufacturing an OLED device in an OLED display panel, organic layers such as a hole injection layer, a hole transport layer, and an organic light-emitting layer need to be stacked on a substrate. For another example, in order to prolong the service life of OLED devices, it is necessary to u...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/84
CPCG01N21/8422
Inventor 安亚斌张铁轶權基瑛闫小宝李彦生
Owner MIANYANG BOE OPTOELECTRONICS TECH CO LTD
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