Distribution network fault locating method and device based on Bayes and complex event processing

A complex event processing and fault location technology, applied in the direction of electrical components, AC network circuits, circuit devices, etc., can solve problems such as exceeding the load limit of feeders, impact of cooling load on distribution network, and impact on user power supply quality, so as to improve efficiency and Accuracy, shortened calculation time, high comprehensive utilization effect

Inactive Publication Date: 2018-03-27
CHINA SOUTHERN POWER GRID COMPANY
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Problems solved by technology

[0004] In the previous distribution network fault location methods, due to the complex topology of the distribution network and the low degree of automation of supporting equipment, only methods such as switch trial operation can be used to determine the fault area. The impact of the cold load may exceed the load limit of the feeder and have a great impact on the quality of power supply for users

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  • Distribution network fault locating method and device based on Bayes and complex event processing
  • Distribution network fault locating method and device based on Bayes and complex event processing
  • Distribution network fault locating method and device based on Bayes and complex event processing

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Embodiment Construction

[0020] In order to further elaborate the technical means and effects that the present invention adopts for reaching the intended invention purpose, below in conjunction with the accompanying drawings and preferred embodiments, the specific implementation, structure, features and effects of the present invention are described in detail as follows:

[0021] figure 1 It is a flowchart of a distribution network fault location method based on Bayesian and complex event processing provided in an embodiment of the present invention. The method of this embodiment can be executed by a distribution network fault location method system based on Bayesian and complex event processing, and the system can be realized by means of software, and can be loaded into a terminal device. refer to figure 1 The distribution network fault location method based on Bayesian and complex event processing provided in this embodiment may include the following steps:

[0022] S101. Acquire grid topology inf...

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Abstract

The invention discloses a distribution network fault locating method based on Bayes and complex event processing. The distribution network fault locating method based on Bayes and complex event processing includes the steps: S101, acquiring the power grid topology information, and dividing distribution network fault locating calculating nodes; S102, according to the divided calculating nodes, acquiring the historical fault data and monitoring information of each node, and calculating the Bayes formula prior probability; S103, constructing a processing model of distribution network fault locating complex events; and S104, acquiring the input information, and outputting the fault locating information after operation through the processing model. The technical scheme of the distribution network fault locating method based on Bayes and complex event processing can calculate the probability of fault nodes by means of the Bayes method, can obtain the fault probability by means of the topology information and the historical fault information and then perform probability calculation according to the real-time fault feedback information and the power grid equipment operation information, and finally can obtain the node with the maximum fault generation possibility so as to realize fault locating.

Description

technical field [0001] The invention relates to a distribution network fault location method and system, in particular to a distribution network fault location method and equipment based on Bayesian and complex event processing. Background technique [0002] With the increase of user load, the scale of distribution network grows rapidly, and the reliability requirements of power supply continue to increase. The importance of fault diagnosis and location of distribution network is increasing day by day. According to statistics, in all power outages that occur to users, more than 80% are caused by power distribution system failures. Timely and accurate judgment of equipment failure locations and fault-affected areas can quickly and accurately isolate equipment failure locations and quickly restore fault-affected areas. The power supply of the non-fault segment is conducive to reducing the power outage time and power outage area, and improving economic benefits. [0003] As th...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H02J3/00
CPCH02J3/00H02J2203/20
Inventor 甘杉张诗军衡星辰陈彬李远宁董召杰张世良
Owner CHINA SOUTHERN POWER GRID COMPANY
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