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Monitoring method and system for abnormal glass substrate forming

A glass substrate, abnormal technology, applied in the direction of comprehensive factory control, electrical program control, comprehensive factory control, etc., can solve the problems of untimely detection of glass substrates, missed judgments, waste of raw materials, etc.

Active Publication Date: 2019-08-02
WUHU TUNGHSU PHOTOELECTRIC SCI & TECHCO +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, due to the observation angle and subjective consciousness of the observers, misjudgment and missed judgment of the glass substrate often occur.
In addition, due to factors such as production tempo, the sampling period is long, and the detection of glass substrates is not timely. Once the glass substrate is abnormally shaped, it cannot be found in time, resulting in a large number of unqualified finished products and waste of raw materials.

Method used

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  • Monitoring method and system for abnormal glass substrate forming
  • Monitoring method and system for abnormal glass substrate forming
  • Monitoring method and system for abnormal glass substrate forming

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Embodiment Construction

[0021] Specific embodiments of the present disclosure will be described in detail below in conjunction with the accompanying drawings. It should be understood that the specific embodiments described here are only used to illustrate and explain the present disclosure, and are not intended to limit the present disclosure.

[0022] figure 1 It is a flow chart of a method for monitoring abnormal formation of a glass substrate according to an embodiment of the present disclosure. Such as figure 1 As shown, the method may include the following steps.

[0023] In step 101, temperatures at multiple preset locations are acquired.

[0024] The glass substrate will present a "bowl"-shaped curved surface in a certain direction during overflow molding, that is, BOW type. At this time, the glass substrate will have a convex side (convex side) and a concave side (concave side). In the case of no abnormality in the molding of the glass substrate, the direction of its bending is the same, ...

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Abstract

The disclosure relates to a method and system for monitoring abnormality in glass substrate forming. The method comprises: temperatures of a plurality of preset positions are obtained, wherein some preset positions are distributed at a target convex side of a glass substrate and the rest preset positions are distributed at a target concave side of the glass substrate; according to the temperaturesof the preset positions distributed at the target convex side of the glass substrate, the temperature of the target convex surface side of the glass substrate is determined, and according to the temperatures of the preset positions distributed at the target concave side of the glass substrate, the temperature of the target concave surface side of the glass substrate is determined; on the basis ofthe temperature of the target convex side and the temperature of the target concave side, whether nay forming abnormality occurs at the glass substrate is determined; and if so, alarming is carried out. Therefore, real-time monitoring of the glass substrate forming is realized; alarming is carried out when forming abnormality occurs at the glass substrate and thus the relevant staff is warned totake remedial measures timely, so that the product scrap rate is reduced and the yield is increased.

Description

technical field [0001] The present disclosure relates to the field of glass substrate production, and in particular, to a method and system for monitoring abnormality of glass substrate molding. Background technique [0002] Glass substrate is one of the key basic materials of the flat panel display industry, and the production process of glass substrate is often accompanied by high process requirements. In the process of producing glass substrates using the overflow method, the glass substrate needs to present a "bowl"-shaped curved surface in a certain direction during overflow molding, that is, BOW type. If the BOW type of the glass substrate changes during the molding process, the quality of the glass substrate such as stress, warpage, and thickness will be greatly affected, thereby reducing the efficiency of the entire production process. In the existing production process of the glass substrate, relevant workers often observe the shape of the glass substrate to detect...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G05B19/418
CPCY02P80/30Y02P90/02
Inventor 苗菲菲李兆廷李震何怀胜许伟王平
Owner WUHU TUNGHSU PHOTOELECTRIC SCI & TECHCO
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