Monitoring method and system for abnormal glass substrate forming
A glass substrate, abnormal technology, applied in the direction of comprehensive factory control, electrical program control, comprehensive factory control, etc., can solve the problems of untimely detection of glass substrates, missed judgments, waste of raw materials, etc.
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[0021] Specific embodiments of the present disclosure will be described in detail below in conjunction with the accompanying drawings. It should be understood that the specific embodiments described here are only used to illustrate and explain the present disclosure, and are not intended to limit the present disclosure.
[0022] figure 1 It is a flow chart of a method for monitoring abnormal formation of a glass substrate according to an embodiment of the present disclosure. Such as figure 1 As shown, the method may include the following steps.
[0023] In step 101, temperatures at multiple preset locations are acquired.
[0024] The glass substrate will present a "bowl"-shaped curved surface in a certain direction during overflow molding, that is, BOW type. At this time, the glass substrate will have a convex side (convex side) and a concave side (concave side). In the case of no abnormality in the molding of the glass substrate, the direction of its bending is the same, ...
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