Near backscattered light measurement system resistant to stray light interference
A backscattered light and measurement system technology, which is applied in the direction of measuring devices, optical instrument testing, machine/structural component testing, etc., can solve the problems of being easily interfered by stray light and low sampling efficiency, and achieve improved time resolution, The measurement result is true and the effect of eliminating the system time error
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[0023] This embodiment is a near-backscattered light measurement system that resists stray light interference, and its structure includes a sampling device and a measuring device.
[0024] see figure 1 , the sampling device includes a spherical vacuum target chamber 1 and an imaging lens 8, the spherical vacuum target chamber 1 is provided with a target point 3 and a diffuse reflection plate 5 with a laser channel for shooting, and the diffuse reflection plate 5 is attached to the inner wall of the spherical vacuum target chamber 1 The ball wall of the spherical vacuum target chamber 1 is provided with a measurement window 7; the nearly backscattered light 4 produced by the shooting laser 2 incident on the target point 3 is diffusely reflected by the diffuse reflection plate 5 after being scattered in the opposite direction of the target, and the diffuse reflection light 6 After penetrating through the measurement window 7, it enters the measurement device through the imaging ...
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