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Process defect risk analysis method based on procedure association relationship

A technology for process defect and risk analysis, which is applied in the field of process defect risk analysis based on process correlation, and can solve problems such as difficult characterization of process defects

Active Publication Date: 2018-06-01
BEIHANG UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Aiming at the problem that product process defects are difficult to characterize, combined with the traditional process failure mode and influencing factor analysis process, the analytic hierarchy process is used to assign weights to the indicators of the three dimensions of defect severity, occurrence and detection

Method used

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  • Process defect risk analysis method based on procedure association relationship
  • Process defect risk analysis method based on procedure association relationship
  • Process defect risk analysis method based on procedure association relationship

Examples

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Embodiment 1

[0114] Taking the three processes of turning the outer circle of the valve core, grinding the outer circle and pairing the grinding as an example, the process defect analysis is carried out and compared with the RPN value in the PFMEA analysis method.

[0115] Optionally, in this embodiment, the specific relative risk calculation process is omitted, and some relevant analysis results are excerpted to obtain Table 2, which is the traditional FPMEA analysis table of the car-grinding-assembly process.

[0116] Table 2

[0117]

[0118]

[0119]

[0120] In the table, GX represents the process, and QX represents the defect.

[0121] The present invention adopts the analytic hierarchy process to distribute the weights of the evaluation indicators of the three dimensions of defect occurrence degree, detection degree and severity degree. Based on expert experience, the weight matrix is ​​determined as ω=[0.4,0.25,0.35], and the directed graph of process defects is establishe...

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Abstract

A process defect risk analysis method based on a procedure association relationship is disclosed, which comprises the steps of S1, analyzing a RPN (risk priority number) of each defect mode accordingto a traditional PFMEA (process failure mode and effects analysis); S2, establishing a process defect fuzzy matrix; S3, performing a fuzzy defect risk analysis; S4, establishing a mutual association matrix between defects; and S5, establishing an associated risk analysis model. The advantages of the method of the invention are that firstly, the association relationship between the defects is considered, the ranking result of obtained defect risk values is compared with that of a traditional RPN analysis method, the risk evaluation result of the fuzzy semantics is quantitatively analyzed, and the degrees of risk of defects with the same or similar RPN values are differentiated; and secondly, the proposed risk analysis method considers the mutual influence relationship of different defects between procedures and thus can reflect the actual processing situation better with respect to the risk evaluation result and have higher reference and application values.

Description

technical field [0001] The invention relates to the field of process defect analysis, in particular to a process defect risk analysis method based on process correlation, which is used to reflect the process defect risk in complex processing. Background technique [0002] The traditional PFMEA: Process Failure Mode and Effects Analysis (PFMEA: Process Failure Mode and Effects Analysis) refers to the failure mode that may occur in the process that does not meet the process requirements, that is, the process defect, which is the degree of non-compliance with a specific process. Description performed. RPN (Risk Priority Number) is often used to quantitatively characterize various defects, and to distinguish and rank defect risks. The specific steps are: [0003] Analyze the defect forms that may occur in each process, and analyze and determine the occurrence degree (O), severity degree (S) and detection degree (D) of each defect form. [0004] Calculate the risk priority numb...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06Q10/06G06F17/50
CPCG06Q10/0635G06F30/00G06F2111/10
Inventor 戴伟吴孟遥吴晓楠
Owner BEIHANG UNIV
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