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A data quality inspection method, device, controller and system

A data quality and data technology, applied in the field of data management, can solve the problems of difficult data management, low data release success rate, and high R&D costs, and achieve the effects of shortening the time for checking data, improving R&D efficiency, and reducing R&D costs

Active Publication Date: 2022-07-01
BAIC GRP ORV CO LTD
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Problems solved by technology

[0004] The purpose of the embodiments of the present invention is to provide a data quality inspection method, device, controller and system, so as to solve the problem of difficult data management, low efficiency, high research and development costs and low success rate of data release in the prior art. The problem

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  • A data quality inspection method, device, controller and system
  • A data quality inspection method, device, controller and system

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Embodiment Construction

[0055] In order to make the technical problems, technical solutions and advantages to be solved by the present invention more clear, the following will be described in detail with reference to the accompanying drawings and specific embodiments.

[0056]The embodiments of the present invention provide a data quality inspection method, device, controller and system in order to solve the problems of high difficulty, low efficiency, high R&D cost, and low success rate of data release during the existing research and development process. The data quality inspection method realizes the unified management of data, ensures that the released data meets the preset requirements, reduces the difficulty of data management and research and development costs, and improves the success rate and accuracy of data release in the product data management system. .

[0057] like figure 1 As shown, an embodiment of the present invention provides a data quality check method, including:

[0058] Step...

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Abstract

The invention provides a data quality inspection method, device, controller and system, and relates to the technical field of data management. The method includes: acquiring data to be inspected; inspecting the data according to preset data quality inspection rules, And obtain the inspection result; release the data in the product data management system according to the inspection result. The solution of the invention realizes the unified management of the data generated in the research and development process, and reduces the difficulty of data management; through the data check in the product data management system, the success rate of data release is improved, and it is convenient for other users to consult and call, and shorten the time R & D cycle, and reduce R & D costs.

Description

technical field [0001] The invention belongs to the technical field of data management, and in particular relates to a data quality inspection method, device, controller and system. Background technique [0002] For R&D projects, in order to shorten the R&D cycle and cost, a large amount of design work is carried out through Computer Aided Design (CAD), and users have higher and higher requirements for the quality of product data designed through CAD. However, With the rapid increase in the amount of product design data, the original extensive product data design method has brought many obstacles to business development, hindering the efficient development of R&D work and the advancement of projects. [0003] Due to the differences in the data structure and design method of the data of various professional products, the lack of unified design specifications has caused great difficulties in management work; only relying on each professional engineer to ensure the quality of t...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F30/20G06F30/10G06Q10/06
CPCG06Q10/06395G06F30/20
Inventor 齐琳琳吕佳颖李迪李原韩天宇
Owner BAIC GRP ORV CO LTD
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