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Path length calibration system and method

A technique of optical path, wavelength of light, used in instrumentation, measurement of color/spectral properties, measurement of magnetic variables, etc.

Active Publication Date: 2021-03-05
热电科学仪器有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, samples with higher light absorption properties may require absorbance measurements at path lengths as short as 30 μm

Method used

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  • Path length calibration system and method
  • Path length calibration system and method
  • Path length calibration system and method

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Embodiment Construction

[0033] In the description of the invention herein, it is to be understood that words presented in the singular encompass their plural counterparts and words presented in the plural encompass their singular counterparts unless otherwise understood or stated, either implicitly or explicitly. Furthermore, it should be understood that for any given component or embodiment described herein, unless implicitly or explicitly understood or stated otherwise, any possible alternatives or alternatives listed for that component may generally be used individually or in combination with each other. Furthermore, it should be understood that the drawings as shown herein are not necessarily drawn to scale, with only some elements being drawn for clarity of the invention. Furthermore, reference numerals may be repeated among the figures to show corresponding or analogous elements. In addition, it is to be understood that any list of such alternatives or alternatives is illustrative only and not...

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Abstract

A device (50) includes a first base surface (13) coupled to i) a swing arm (54) and ii) a light source having a first optical fiber (18a). The apparatus further comprises a magnet (1), a base plate (52), a mechanical stop (53) coupled to the base plate, and a second base surface (15) mechanically coupled to The base plate and configured to receive a liquid sample, the second base surface is coupled to a spectrometer having a second optical fiber (18b), the distance between the two surfaces defines an optical path length for optical sample analysis. The device further comprises a flux sensor (10), such as a Hall sensor, positioned between the north and south flux fields of the magnet such that between the mechanical stop and the swing arm magnetic flux reaching the sensor upon physical contact provides a linear output range of the flux sensor; and a processor adapted to calibrate a minimum magnetic flux field using a threshold flux field emitted from the magnet and detected by the flux sensor The point of the optical path length.

Description

[0001] Cross References to Related Applications [0002] This application claims U.S. Provisional Patent Application Nos. 62 / 220,536, filed September 18, 2015, and 62 / 306,793, filed March 11, 2016, entitled PATH LENGTH CALIBRATION SYSTEMAND METHOD priority of U.S. Provisional Patent Application No. , both of which are incorporated herein by reference in their entirety technical field [0003] The present invention generally relates to path length calibration of an apparatus for measuring optical properties of a sample. Background technique [0004] Liquids, mixtures, solutions and reaction mixtures are often characterized using optical techniques such as spectrophotometry. In order to characterize samples of these liquids, the liquids are usually contained in containers called cuvettes or cuvettes that have two or more sides of optical quality and pass through those wavelengths needed to characterize the liquid contained therein. When dealing with extremely small sample v...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/03G01D5/00G01N21/31
CPCG01N21/31G01N2021/035G01N2021/036G01N2201/0668G01D5/145G01N21/0303G01N2201/08G01N21/27G01R33/07G01R33/093
Inventor D·W·阿什米德J·V·霍华德K·K·金A·M·布拉施
Owner 热电科学仪器有限公司