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A damage model and impact analysis method for missile weapon equipment

An impact analysis, missile weapon technology, applied in the direction of instrument, data processing application, calculation, etc., can solve the problem of in-depth, incomplete equipment damage mode and mechanism analysis, equipment survivability, reliability, mission safety design and rapid repair work Analysis of problems such as inadequate analysis to achieve high survivability, clear thinking, and reasonable processes

Active Publication Date: 2022-03-04
BEIJING INST OF ELECTRONICS SYST ENG
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Problems solved by technology

[0005] The purpose of the present invention is to provide a kind of missile weapon equipment damage mode and impact analysis method considering combat threat, special event and technical process, solve the problem that the existing DMEA method is not comprehensive and in-depth to equipment damage mode and mechanism analysis, and its The problems of equipment survivability, reliability, mission safety design and rapid repair work analysis are not in place

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  • A damage model and impact analysis method for missile weapon equipment
  • A damage model and impact analysis method for missile weapon equipment
  • A damage model and impact analysis method for missile weapon equipment

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Embodiment Construction

[0042] In order to illustrate the present invention more clearly, the present invention will be further described below in conjunction with preferred embodiments and accompanying drawings. Similar parts in the figures are denoted by the same reference numerals. It should be understood by those skilled in the art that the content specifically described below is illustrative rather than restrictive, and should not limit the protection scope of the present invention with this.

[0043] The present invention is a damage mode and impact analysis method of missile weaponry considering combat threats, special events and technical processes, mainly based on traditional DMEA analysis based on equipment survivability, reliability, mission safety design and rapid repair work analysis requirements method, expand the connotation of DMEA, and construct a comprehensive DMEA analysis method, that is, on the basis of traditional DMEA analysis, analyze the damage mechanism from three aspects: c...

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Abstract

The invention discloses a damage mode and impact analysis method of missile weapons and equipment, comprising the following steps: 1) analyzing damage mechanism; 2) determining damage mode; 3) evaluating technical process and its potential damage risk level; 4) designing improvement measures; 5) Determine the damage maintenance work items. The invention constructs a damage mode and impact analysis method of missile weapons and equipment that comprehensively considers combat threats, special events and technical processes, makes up for the limitation and one-sidedness of the current DMEA method that only considers combat damage, and has strong operability and high engineering application value.

Description

technical field [0001] The invention relates to a damage mode and impact analysis method, in particular to a missile weapon equipment damage mode and impact analysis method. Background technique [0002] With the continuous improvement of the informatization, intelligence and integration of missile weapons and equipment, the advanced equipment technology, functional integration and structural complexity are getting higher and higher. At the same time, they are facing more harsh and harsh working and operating environments, and Complex and changeable combat environment with all-round and multi-element attack threats. The resulting multiple damage, fatality, randomness, and cross-linking of equipment maintenance and support problems have become increasingly prominent. Ensuring high survivability, high reliability, high mission safety, and success has become the key to high combat effectiveness of missile weapons and equipment. Core requirements, damage modes and impact analys...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06Q10/00G06Q10/06
CPCG06Q10/0635G06Q10/20
Inventor 陶小创何俊曲丽丽倪晓峰
Owner BEIJING INST OF ELECTRONICS SYST ENG
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