Ultrashort distance laser detection device for atomic force microscope

Abstract

The invention discloses an ultrashort distance laser detection device for an atomic force microscope. The ultrashort distance laser detection device for the atomic force microscope comprises an optical objective lens component and a laser detection head arranged under the optical objective lens component; the laser detection head comprises an internally hollow casing body, a laser component, a probe frame component and a position detector component; the laser component, the probe frame component and the position detector component are arranged in the inner part of the casing body; the opticalobjective lens component comprises an objective lens turntable and a plurality of objective lenses with different magnification times, the objective lenses are peripherally distributed on the objective lens turntable, and the magnification time of the objective lens is 4-100 times. The ultrashort distance laser detection device for the atomic force microscope has the beneficial effects that the problem of inaccurate positioning of the low-power objective lens of the existing device is thoroughly solved, the magnification time and the optical view can be freely switched according to the actualcondition of a sample, the operability of the atomic force microscope is greatly facilitated, and a to-be-detected sample area is also easily found.

Description

Technical field [0001] The invention relates to the field of precision measuring instruments, in particular to an atomic force microscope ultra-short-distance laser detection device. Background technique [0002] Atomic force microscopy studies the surface structure and properties of substances by detecting the extremely weak interatomic interaction between the surface of the sample to be tested and a miniature force-sensitive element. Fix one end of a pair of micro cantilever that is extremely sensitive to force, and the micro needle tip at the other end is close to the sample. At this time, the needle tip will interact with the sample, and the force will cause the micro cantilever to deform or change its motion state. In order to obtain information on the surface of the sample, a laser inspection method is generally used, and this corresponding device is also called a laser inspection scanning head. The laser beam hits the back of the probe cantilever and is reflected on the p...

AI Technical Summary

Problems solved by technology

[0004] Aiming at the deficiencies in the prior art, the purpose of the present invention is to provide an ultra-short-distance laser detection device for an atomic force microscope to solve the problem that the existing laser detection scanning head cannot use a high-power optical objective lens for precise positioning due to structural limitations. , Inconvenient use, etc.

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