Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Electronic device and control method thereof

An electronic device and controller technology, applied in hardware monitoring, electrical digital data processing, instruments, etc., can solve the problems of time-consuming, inability to measure the state of the chip with sensors, and inability to use, and achieve accurate chip performance analysis and continuous monitoring of chips. Status, effect of shortening time interval

Active Publication Date: 2021-07-13
REALTEK SEMICON CORP
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, when the user activates or reads the sensor through the user interface, most of the time is spent in the activation or reading process, so it is difficult to measure the continuous change of the chip state in a short time
In addition, in some specific applications, the user interface is disabled, so it is impossible to control the sensor to measure the chip status at this time through the user interface

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Electronic device and control method thereof
  • Electronic device and control method thereof
  • Electronic device and control method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0015] The following disclosure provides many different embodiments or illustrations for implementing the features of the invention. The present disclosure may repeatedly refer to numerals and / or letters in different examples, and these repetitions are for simplification and illustration, and do not specify the relationship between different embodiments and / or configurations in the following discussion.

[0016] As used herein, "coupling" or "connection" can refer to two or more elements that are in direct physical or electrical contact with each other, or that are indirect physical or electrical contact with each other, and "coupling" or " "Connected" may also refer to the mutual operation or action of two or more elements.

[0017] Please refer to figure 1 . figure 1 is a schematic diagram of an electronic device 100 according to an embodiment of the present invention. The electronic device 100 includes a controller 110 , a user interface 120 and a sensor 130 . The user ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to an electronic device and a control method thereof. The electronic device includes a controller, a user interface and a sensor, and the user interface and the sensor are coupled to the controller. The user interface is used for sending a first user command to the controller to control the controller to enter the burst mode. The controller is used for controlling the sensor to continuously measure the chip or the environment of the chip to generate a plurality of sensing values ​​and generate sensing data according to the sensing values ​​when entering the burst mode upon receiving the first user instruction.

Description

technical field [0001] This application relates to an electronic device and its control method, and in particular to an electronic device and its control method for sensing chip state in burst mode. Background technique [0002] In the design of a system on chip (SOC), embedded sensors (such as voltage sensors, process variation sensors, speed sensors, and temperature sensors) are often used to monitor the state of the chip. However, when the user activates or reads the sensor through the user interface, most of the time is spent on the activation or reading process, so it is difficult to measure the continuous change of the chip state in a short time. In addition, in some specific applications, the user interface is not available, so the sensor cannot be controlled through the user interface to measure the state of the chip at this time. Contents of the invention [0003] One aspect of the present application is to provide an electronic device, which includes a controlle...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/30
CPCG06F11/3024G06F11/3055
Inventor 郭俊仪陈莹晏李日农
Owner REALTEK SEMICON CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products