A test requirement view generation method and ate test method
A technology for testing requirements and views, applied in the fields of instrumentation, computing, electrical and digital data processing, etc., can solve the problems of inconsistent test information, wrong description, and many people, and achieve the effect of improving the efficiency of test development.
Active Publication Date: 2020-08-21
BEIHANG UNIV +1
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[0005] In view of the above analysis, the present invention aims to provide a method for generating a test requirement view and an ATE test method to solve the problem of inconsistent, incomplete and wrong description of test information caused by a large number of personnel and complicated and lengthy domain knowledge in the current ATE development process. question
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[0045] Preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, wherein the accompanying drawings constitute a part of the application and together with the embodiments of the present invention are used to explain the principle of the present invention and are not intended to limit the scope of the present invention.
[0046] A specific embodiment of the present invention discloses a method for generating a test requirement view. The schematic diagram of the method for generating a test requirement view is as follows figure 1 shown.
[0047] During implementation, the specific work steps are as follows:
[0048] Step S1, constructing a test signal view template, a test device view template, and a device under test view template;
[0049] Step S2, combining the test signal view template, the test equipment view template, and the device under test view template to construct a test flow view template;
[005...
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The invention relates to a test demand view generation method and an ATE test method, belongs to the technical field of ATE testing, and solves the problems of test information inconsistency, incompleteness and description errors caused by much personnel and complex and lengthy domain knowledge in an ATE development process in the prior art. The test demand view generation method specifically comprises the steps of constructing a test signal view template, a test device view template and a tested device view template; in combination with the test signal view template, the test device view template and the tested device view template, constructing a test process view template; performing visual display on the four view templates in combination with Snail GUI through Eclipse to obtain visualviews of views; and according to test demands, obtaining specific values of field attributes related to view modules, and adding the specific values into the corresponding visual views, thereby generating a test demand view. A user is facilitated to visually understand test information, so that the test efficiency is improved.
Description
technical field [0001] The invention relates to the technical field of ATE testing, in particular to a method for generating a test requirement view and an ATE testing method. Background technique [0002] With the development of science and technology, the design of various hardware devices is becoming more and more complex, and the functions are becoming more and more powerful. Therefore, the generalization, standardization, and miniaturization of test equipment or platforms have become the development trend in the test field. [0003] ATE is the English abbreviation of Automatic Test Equipment. ATE is mainly used for signal testing of hardware equipment (such as voltage, current, resistance, etc.). Due to the wide variety of tested equipment and the different standards and specifications followed, even for the same kind of tested equipment, there are differences between different manufacturers and different models. Therefore, most ATEs are special equipment used to tes...
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IPC IPC(8): G06F8/38G06F9/451
CPCG06F8/38G06F9/451
Inventor 吴际孟翰崔明宝
Owner BEIHANG UNIV