Method and device for measuring internal stress of oxide film through prefabricated marker
A marker and internal stress technology, applied in the field of materials, can solve the problem of low measurement accuracy of the internal stress of the oxide film, and achieve the effect of improving the measurement accuracy
Active Publication Date: 2018-09-11
TSINGHUA UNIV
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[0005] In view of this, the present disclosure proposes a method and device for measuring the internal stress of the oxide film through prefabricated markers to solve the problem of low measurement accuracy of the internal stress of the oxide film in the related art
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[0024] Various exemplary embodiments, features, and aspects of the present disclosure will be described in detail below with reference to the accompanying drawings. The same reference numbers in the figures indicate functionally identical or similar elements. While various aspects of the embodiments are shown in drawings, the drawings are not necessarily drawn to scale unless specifically indicated.
[0025] The word "exemplary" is used exclusively herein to mean "serving as an example, embodiment, or illustration." Any embodiment described herein as "exemplary" is not necessarily to be construed as superior or better than other embodiments.
[0026] In addition, in order to better illustrate the present disclosure, numerous specific details are given in the following specific implementation manners. It will be understood by those skilled in the art that the present disclosure may be practiced without some of the specific details. In some instances, methods, means, componen...
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The present invention relates to a method and device for measuring the internal stress of an oxide film through a prefabricated marker. The invention aims to solve the problem of low measurement accuracy of the internal stress of an oxide film in the prior art. The method for measuring the internal stress of the oxide film includes the following steps that: the first image of the surface of a testpiece before the test piece is oxidized is obtained, a marker being attached to the surface of the test piece; the second image of the surface of the test piece after the test piece is oxidized is obtained; the first size parameter and second size parameter of the marker are extracted from the first image and the second image; and the internal stress of the oxide film is determined according to the first size parameter and second size parameter. According to the method and device for measuring the internal stress of the oxide film through the prefabricated marker of the invention, the internal stress of the oxide film is determined on the basis of the tiny difference of the size of the marker in the image of the test piece which is obtained before the test piece is oxidized and the size of the marker in the image of the test piece which is obtained after the test piece is oxidized, and therefore, the accuracy of the measured internal stress of the material oxide film can be improved.
Description
technical field [0001] The present disclosure relates to the field of material technology, and in particular to a method and device for measuring the internal stress of an oxide film by using a prefabricated marker. Background technique [0002] At present, with the progress of experimental conditions and experimental technology, various new materials are emerging and widely used in high-tech fields and some extreme environments. Based on this, more stringent requirements are put forward for the reliability and safety of materials. Require. For high-temperature structural materials, the surface is exposed to the air, and a very serious oxidation reaction often occurs, resulting in the formation of an oxide film on the surface. The dense oxide film can inhibit further oxidation, but it will also generate stress in the oxide film, and the stress will be This will lead to cracking and peeling of the oxide film and coating, which will lead to interface and material failure. Me...
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IPC IPC(8): G01L1/24
CPCG01L1/24
Inventor 冯雪李燕方旭飞
Owner TSINGHUA UNIV