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Universal fixture for highly accelerated centrifugal test of large dual-in-line devices

A centrifugal test and dual-in-line technology, which is applied in the testing of machines/structural components, testing of mechanical components, instruments, etc., can solve problems such as poor dynamic balance performance of fixtures, limited types, and easy misuse of sub-fixtures. Achieve the effects of avoiding low test efficiency, ingenious technical ideas, and enhancing versatility

Active Publication Date: 2018-09-28
NO 24 RES INST OF CETC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, when performing high-acceleration centrifugal tests on such tube and shell devices, most of the fixtures used are special fixtures, which do not have universality; a few existing fixtures are universal, but they can only adapt to a few fixed models. The types are limited and cannot meet the diversity of large dual-in-line devices, that is, the versatility is not strong, which makes Y 1 There are many problems in the high-acceleration centrifuge test in the direction of
[0004] If a fixture with low versatility is used for the test, that is, the device is barely assembled with the fixture, it will go through a cumbersome and complicated assembly process before the test, such as adding additional positioning measures, resulting in extremely low test efficiency; If it does not completely match the fixture, there will be problems with the consistency of the clamping force, force-bearing surface, and force-bearing direction, which will easily cause tiny cracks in the device under high-acceleration centrifugal conditions, resulting in sealing failure of the device; and the dynamics of the fixture Poor balance performance directly affects the service life of the shaft of the centrifugal test equipment
[0005] If you continuously design new sub-fixtures for different devices, not only the cost is high and the cycle is long, but the number of sub-fixtures will also increase. It is very difficult to find a suitable sub-fixture, and it is easy to misuse the sub-fixtures

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  • Universal fixture for highly accelerated centrifugal test of large dual-in-line devices
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  • Universal fixture for highly accelerated centrifugal test of large dual-in-line devices

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Embodiment Construction

[0027] The preferred embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

[0028] Such as Figure 1-9 , a universal fixture for high-acceleration centrifugal testing of large dual-in-line devices, including a base plate 1, a slider 2, a guide bar 3, a clamping groove 4, and a magnetic rubber sheet 5; the base plate 1 is made of a magnetic metal material, and its There is a slide rail 11 in the middle; two of the sliders 2 are arranged opposite to each other in a long strip shape, the bottom of which is provided with a chute 21 that matches the profile of the slide rail 11, and the top is vertically provided with a second chute 21 that passes through the chute 21. A locking hole 22, the opposite side of the two sliders 2 is a first wedge-shaped surface 23, and the side away from it is a stepped surface 24; the stepped surface 24 is provided with a first connecting hole 25 along the length direction of the slider 2;...

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Abstract

The invention discloses a universal fixture for highly accelerated centrifugal test of large dual-in-line devices, for the field of test equipment. The universal fixture comprises a base plate, sliders, a guide bar, a clamping slot and magnetic rubber pieces. The fixture has two degrees of freedom based on its sliding and expansion, can be regulated freely within a certain range according to outline dimensions of large dual-in-line devices of different length and width to meet clamping requirements of most dual-in-line devices, and thus, the universality of the fixture is improved greatly, full matching between the fixture and a tested device is guaranteed, problems such as low test efficiency, failure in sealing, cracking of device tubes and shells and high cost caused by poor universality of the fixture can be avoided, and the whole design is of skillful technical thought and simple structure and is economic and efficient.

Description

technical field [0001] The invention belongs to the field of testing equipment, and in particular relates to a universal fixture for high-acceleration centrifugal testing of large dual in-line components. Background technique [0002] Environmental testing is a test technology for assessing product quality and reliability. It aims to eliminate defective and unqualified products and ensure that their quality and reliability meet the actual use requirements. As an important environmental test, the high-acceleration centrifuge test mainly assesses the stability of the internal structure of certain electronic components under the condition of high-speed rotation (centripetal acceleration ≥ 10000g). [0003] As a common packaging form, large dual-in-line packaging is widely used in the packaging process of military components such as analog ICs, micro-acoustics, and optics. The length C, width K, and length C1 of the metal cover vary with the number of pins of the large dual-in-...

Claims

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Application Information

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IPC IPC(8): G01M13/00
CPCG01M13/00
Inventor 朱朝轩罗俊李晓红吴兆希谭骁洪秦国林张锋唐毅唐游
Owner NO 24 RES INST OF CETC