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A system and method for testing throughput between ipc and ap

A technology of throughput and testing tools, applied in transmission systems, wireless communications, electrical components, etc., can solve the problems of low test efficiency, waste of manpower, and time-consuming, and achieve the effect of saving manpower and improving test efficiency

Active Publication Date: 2022-02-25
SHENZHEN GONGJIN ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Using the above method, when testing different APs, it is necessary to manually modify the page parameters, connect to the SSID and record the test data, which wastes a lot of manpower. Recording test data will consume a lot of time, and the test efficiency is low

Method used

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  • A system and method for testing throughput between ipc and ap
  • A system and method for testing throughput between ipc and ap
  • A system and method for testing throughput between ipc and ap

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Embodiment Construction

[0041] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0042] The embodiment of the invention discloses a system and method for testing the throughput between the IPC and the AP, which reduces the manpower consumed in the throughput test between the IPC and the AP and improves the testing efficiency.

[0043] See figure 1 , figure 1 It is a schematic structural diagram of a system for testing the throughput between IPC and AP disclosed in the embodiment of the present invention. It should be noted that, in this e...

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Abstract

The invention discloses a system for testing the throughput between an IPC and an AP, which includes a main control terminal, an IPC and at least one AP. The main control terminal is connected to the IPC and each AP respectively. With this scheme, the main control terminal modifies the page parameters of the selected target AP, controls the connection between the IPC and the target AP, and automatically generates a test report, avoiding the need for artificial methods. Modify the page parameters of the target AP, connect the IPC and the target AP, and manually record the test data, which greatly saves manpower and improves the test efficiency. In addition, the invention also discloses a method for testing the throughput between the IPC and the AP, and the effect is as above.

Description

technical field [0001] The invention relates to the technical field of automated testing, in particular to a system and method for testing throughput between an IPC and an AP. Background technique [0002] The compatibility test between the IPC and the AP is the most common solution for testing the performance of the IPC. The test between the IPC and the AP is tested through the connection between the IPC and the AP's uplink port. After the IPC is connected to different APs, the performance of the IPC can be tested by testing different APs. Wherein, the compatibility between the IPC and the AP can be reflected by the throughput between the IPC and the AP, that is, the compatibility between the IPC and the AP can be measured by testing the throughput between the AP and the IPC. [0003] When testing the performance of IPC through different APs, it is necessary to manually modify various wireless parameters on the AP page to test the throughput between the AP and IPC, such as...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04L43/0888H04L43/50H04W24/06
CPCH04L43/0888H04L43/50H04W24/06
Inventor 陈孟雪袁良伟孙聃雷志平谢永刚万章保孟永发
Owner SHENZHEN GONGJIN ELECTRONICS CO LTD
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