Characterization method for internal reflection optical utilization of photovoltaic module ribbon
A photovoltaic module and internal reflection technology, which is used in photovoltaic power generation, electrical components, semiconductor devices, etc., can solve the problems that the optical utilization rate of photovoltaic modules is out of the estimated range, and the evaluation of the optical utilization rate of internal reflection cannot be welded.
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[0037] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.
[0038] The invention provides a method for characterizing the utilization rate of internal reflection optics of a photovoltaic module soldering strip, so as to overcome the defects in the prior art. The invention mainly sets the laminated parts of the reference group and the laminated parts of the comparison group, and normalizes the short-circuit current of the laminated parts of the comparison group, so as to obtain the optical utilization rate of internal reflection of the welding strip. In this embodiment, the reference group of laminates is laminated from the reference group 100 , and the comparison group of laminates is laminated from the comparison group 200 .
[0039] see Figure 1 to Figure 2 As shown, it is a schematic structural diagra...
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