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Directional detecting system of crystal bar

A detection system and crystal rod technology, which are used in measuring devices, semiconductor/solid-state device testing/measurement, stone processing equipment, etc. problems, to achieve the effect of improving detection accuracy and detection efficiency, and meeting the accuracy requirements

Pending Publication Date: 2018-11-06
DANDONG NEW DONGFANG CRYSTAL INSTR
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In the above process, the angle detection of crystal rod is particularly important. Once a deviation occurs, it will not only affect the bonding accuracy, but also seriously affect the accuracy of subsequent monocrystalline silicon slices, resulting in a high failure rate of crystal sliced ​​products

Method used

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  • Directional detecting system of crystal bar
  • Directional detecting system of crystal bar
  • Directional detecting system of crystal bar

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Experimental program
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Embodiment Construction

[0025] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0026] Such as Figure 1~6 As shown, the present invention includes a moving mechanism 1, a rotating mechanism 2, a support plate 3, an X-ray generating assembly 5 and a signal system assembly 6. The rotating mechanism 2 is installed on the moving mechanism 1, and the rotating mechanism 2 passes through the The moving mechanism 1 is driven to move, the supporting plate 3 is installed on the front end of the rotating mechanism 2, and the supporting plate 3 is driven to rotate by the rotating mechanism 2, and a positioning probe 301 is arranged on the supporting plate 3, and the The center of the positioning probe 301 coincides with the central axis of the rotating mechanism 2, and the X-ray generation component 5, the signal system component 6, the first adjustment mechanism and the second adjustment mechanism are arranged on the support plate 3, and the X-ray...

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PUM

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Abstract

The invention relates to the technical field of crystal processing, and specifically relates to a directional detecting system of a crystal bar. The system comprises a moving mechanism, a rotating mechanism, a bearing plate, an X-ray generating assembly and a signal system assembly, wherein the rotating mechanism is mounted on the moving mechanism and can be driven by the moving mechanism to move;the bearing plate is mounted at the front end of the rotating mechanism and is driven to rotate through the rotating mechanism; a positioning probe, the X-ray generating assembly, the signal system assembly, a first adjusting mechanism and a second adjusting mechanism are arranged on the bearing plate; the positioning probe is propped to the crystal bar during detection; the X-ray generating assembly is driven to circumferentially move through the first adjusting mechanism; the signal system assembly is driven to move in a circular arc shape through the second adjusting mechanism. The systemis capable of accurately detecting the angle information of the crystal bar, so that the crystal bar angle detecting accuracy and the detecting efficiency can be greatly improved.

Description

technical field [0001] The invention relates to the technical field of crystal processing, in particular to a crystal rod orientation detection system. Background technique [0002] Before processing the artificially grown monocrystalline silicon ingots into wafers of various specifications, it is necessary to orient the rough ingots first. After finding out the required direction, use the grinding equipment to process the cylindrical surface of the ingot into a reference edge or Notch, and then bond the ingot to the material plate according to the measured angle value, and when bonding the ingot, the reference edge or notch of the crystal ingot cylinder must point to the specified angle. In the above process, the angle detection of crystal rod is particularly important. Once deviation occurs, it will not only affect the bonding accuracy, but also seriously affect the accuracy of subsequent monocrystalline silicon slicing, resulting in a high failure rate of crystal slicing ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/20H01L21/66
CPCH01L21/00G01N23/20G01N23/20016G01N23/20025B28D5/0058
Inventor 甄伟赵松彬
Owner DANDONG NEW DONGFANG CRYSTAL INSTR
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